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  • Other Sources  (7)
  • NASA Technical Reports  (7)
  • ELECTRONIC EQUIPMENT  (7)
  • 1995-1999
  • 1970-1974  (7)
  • 1950-1954
  • 1
    Publication Date: 2011-08-16
    Description: Dielectric covered narrow radiating slots in rectangular waveguide broad face, calculating impedance from equivalent circuits
    Keywords: ELECTRONIC EQUIPMENT
    Type: ; RNIER-POST (
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  • 2
    Publication Date: 2011-08-16
    Description: Stacked, vertically polarized collinear arrays of independently fed omnidirectional antennas for flight testing Doppler radar aircraft warning system
    Keywords: ELECTRONIC EQUIPMENT
    Type: ; ACE(
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  • 3
    Publication Date: 2011-08-16
    Description: Admittance measurements of rectangular or circular waveguide fed aperture antennas illuminating displaced metal plate
    Keywords: ELECTRONIC EQUIPMENT
    Type: ; SEARCH(
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  • 4
    Publication Date: 2019-06-27
    Description: Hermetically sealed, wound, AC, polycarbonate capacitors incorporating design improvements recommended in a previous study were designed and built. A 5000 hour, 400 Hz ac life test was conducted using 384 of these capacitors to verify the adequacy of the design improvements. The improvements incorporated in the capacitors designed for this program eliminated the major cause of failure found in the preceding work, termination failure. A failure cause not present in the previous test became significant in this test with capacitors built from one lot of polycarbonate film. The samples from this lot accounted for 25 percent of the total test complement. Analyses of failed samples showed that the film had an excessive solvent content. This solvent problem was found in 37 of the total 46 failures which occurred in this test. The other nine were random failures resulting from causes such as seal leaks, foreign particles, and possibly wrinkles.
    Keywords: ELECTRONIC EQUIPMENT
    Type: NASA-CR-121238
    Format: application/pdf
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  • 5
    Publication Date: 2019-06-27
    Description: The fabrication yield of an on-chip modifiable redundant circuit design for a 100M bit serial shift register is evaluated. The yield model is a redundancy design in which there is a primary loop and a set of secondary loops which can be enabled/disabled without introducing blanks to the data stream. This function has a finite yield, the loop-modification yield factor, which must be greater than 0.9 to make the system more economical than the simple nonredundant design. It is further established that small loop capacities greatly degrade the yield because of the effect of the modification yield factor, while large loop capacities degrade the yield because of defects in the operating area. As the modification yield increases the optimum loop capacity decreases. An optimum value for the number of redundant loops exists for each loop capacity. Other factors that affect the yield are the garnet film and the processed circuit.
    Keywords: ELECTRONIC EQUIPMENT
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  • 6
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    In:  CASI
    Publication Date: 2019-06-27
    Description: Electromagnetic wave energy is converted into electric power with an array of mutually insulated electromagnetic wave absorber elements each responsive to an electric field component of the wave as it impinges thereon. Each element includes a portion tapered in the direction of wave propagation to provide a relatively wideband response spectrum. Each element includes an output for deriving a voltage replica of the electric field variations intercepted by it. Adjacent elements are positioned relative to each other so that an electric field subsists between adjacent elements in response to the impinging wave. The electric field results in a voltage difference between adjacent elements that is fed to a rectifier to derive dc output power.
    Keywords: ELECTRONIC EQUIPMENT
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  • 7
    Publication Date: 2019-07-13
    Description: Thin film lumped element microwave integrated circuits from concept to final functional devices
    Keywords: ELECTRONIC EQUIPMENT
    Type: ANNUAL ELECTRONIC COMPONENTS CONFERENCE; May 13, 1970 - May 15, 1970; WASHINGTON, DC; US
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