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  • Articles  (2)
  • Articles: DFG German National Licenses  (2)
  • 1985-1989  (2)
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  • Articles  (2)
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  • 1
    Electronic Resource
    Electronic Resource
    A differential interferometer for force microscopy (1989)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 60 (1989), S. 3131-3134 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We present a polarizing optical interferometer especially developed for force microscopy. The deflections of the force-sensing cantilever are measured by means of the phase shift of two orthogonally polarized light beams, both reflected off the cantilever. This arrangement minimizes perturbations arising from fluctuations of the optical path length. Since the measured quantity is normalized versus the reflected intensity, the system is less sensitive to intensity fluctuations of the light source. The device is especially well suited to static force measurements. The total rms noise measured is (approximately-less-than)0.01 A(ring) in a frequency range from 1 Hz to 20 kHz.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1140543
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Scanning tunneling microscopy as a tool to study surface roughness of sputtered thin films (1989)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 66 (1989), S. 4258-4261 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A three-dimensional image of the surface roughness of four conducting iron-oxide Fe3O4 thin films was obtained using a scanning tunneling microscope. We obtain grain size and surface roughness of films deposited on Si(100) by reactive sputtering at different substrate temperatures. The apparent grain size lies between 10 and 50 nm, and depends on the substrate temperature and film thickness. We have also determined the scanning tunneling microscopy parameters (tip size and shape) to obtain "real'' images (i.e., images without artifacts) of the films.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.343967
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    Paper (German National Licenses)
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