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  • 1
    Electronic Resource
    Electronic Resource
    Debye–Waller factors of compounds with the caesium chloride structure (2000)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 56 (2000), S. 519-524 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The lattice dynamics of five compounds with the caesium chloride structure have been investigated using shell models. Debye–Waller factors for these compounds are calculated over the temperature range from 1 to 1000 K and the results are presented analytically in a polynomial form. When experimental results are available, the calculated results are compared to the experimentally measured Debye–Waller factors and typically the discrepancies between these factors are less than 10%.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767300007558
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  • 2
    Electronic Resource
    Electronic Resource
    Dynamical diffraction calculations for RHEED and REM (1986)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 42 (1986), S. 545-552 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The multislice formulation of the many-beam dynamical diffraction theory has been applied to the Bragg case of electron diffraction for the extended surface of a perfect crystal and also for a crystal surface with a surface step. The wavefunctions within and outside the crystal have been calculated and used to derive the standing-wave pattern in the top atomic layers of the crystal, the intensities of the reflection high-energy electron diffraction (RHEED) pattern and the contrast of the reflection electron microscopy (REM) image. Calculations made for the diffraction of 19, 40 and 80 keV electrons from (111) surfaces of Pt and Au demonstrate the channeling of electrons under the conditions of surface resonance, the perturbation of the standing-wave field in the crystal by a one-atom-high surface step and the REM contrast for a through-focus series of images of a surface step. The method is applicable to models including surface relaxations and reconstructions and any kind of local defect of the surface or of the bulk crystal.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767386098756
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  • 3
    Electronic Resource
    Electronic Resource
    Errors arising from numerical use of the Mott formula in electron image simulation (1988)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 44 (1988), S. 1-6 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The Mott formula relating the electron scattering factor to that for X-rays is inaccurate in its numerical form in the small-angle region. Effects of the inaccuracy on both kinematic and dynamical diffraction have been investigated. Some artifacts arising from the inaccuracy have been found in simulated electron microscopy images. A modified form for the Mott formula, which minimizes the error, is proposed. However, for any accurate and reliable calculation only those electron scattering factors derived directly from the atomic potential can be used.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767387006858
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  • 4
    Electronic Resource
    Electronic Resource
    Diffraction contrast in reflection electron microscopy-I. Screw dislocation
    Amsterdam : Elsevier
    Micron And Microscopica Acta 18 (1987), S. 171-178 
    Details
    ISSN: 0739-6260
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General
    Type of Medium: Electronic Resource
    URL: http://linkinghub.elsevier.com/retrieve/pii/0739-6260(87)90053-0
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  • 5
    Electronic Resource
    Electronic Resource
    Diffraction contrast in reflection electron microscopy-II. Surface steps and dislocations under the surface
    Amsterdam : Elsevier
    Micron And Microscopica Acta 18 (1987), S. 179-186 
    Details
    ISSN: 0739-6260
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General
    Type of Medium: Electronic Resource
    URL: http://linkinghub.elsevier.com/retrieve/pii/0739-6260(87)90054-2
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  • 6
    Electronic Resource
    Electronic Resource
    On the damping of coherence in the small-angle inelastic scattering of high-energy electrons by crystals
    Amsterdam : Elsevier
    Physics Letters A 170 (1992), S. 111-115 
    Details
    ISSN: 0375-9601
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://linkinghub.elsevier.com/retrieve/pii/0375-9601(92)90783-I
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  • 7
    Electronic Resource
    Electronic Resource
    Evidence for the damping of coherence in inelastic scattering of high-energy electrons by crystals
    Amsterdam : Elsevier
    Physics Letters A 175 (1993), S. 461-464 
    Details
    ISSN: 0375-9601
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://linkinghub.elsevier.com/retrieve/pii/0375-9601(93)91001-L
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  • 8
    Electronic Resource
    Electronic Resource
    Void-like defects in annealed Czochralski silicon (1998)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 73 (1998), S. 2311-2312 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Void-like defects of octahedron structure having {111} facets were observed in annealed Czochralski silicon. The amorphous coverage of SiOx and SiCx on the inner surface of the defects was identified using transmission electron microscopy and electron energy-loss spectroscopy. It is suggested that these defects are a kind of amorphous precipitate origin. A mechanism for the generation of these defects and the previously reported solid amorphous precipitates is proposed. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.121807
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  • 9
    Electronic Resource
    Electronic Resource
    Accurate measurement of phase shift in electron holography (1998)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 72 (1998), S. 771-773 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A method is proposed for the accurate measurement of phase shift in electron holography. The method is based on the use of moiré fringes resulting from the subtraction of a null electron hologram by a real object hologram recorded under slightly different experimental conditions. This method does not require any optical or digital reconstruction of the electron hologram, and is shown to be highly sensitive to the phase shift of the electron wave passing through an object. Using experimental results obtained from a single particle of silicon, we demonstrate that the sensitivity of this method to phase shift may easily be amplified by more than 11 times compared with the conventional method using an ordinary electron hologram. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.120888
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  • 10
    Electronic Resource
    Electronic Resource
    Preparation and structure analysis of titanium oxide nanotubes (2001)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 79 (2001), S. 3702-3704 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Well crystallized nanoscale tubular materials have been synthesized via the reaction of TiO2 crystals of either anatase or rutile phase and NaOH aqueous solution. The atomic structure of the synthesized tubular material is imaged by high-resolution transmission electron microscopy (HRTEM), and the composition of individual tubular structures is determined using selected area energy dispersive X-ray spectroscopy (EDX). Our results show that the tubular materials are well crystallized tubes with an average diameter of about 9 nm and little dispersion, and are composed of mainly titanium and oxygen. The atomic ratio of O/Ti is found, however, to vary from tube to tube. Detailed electron and x-ray diffraction studies show that the structure of our titanium oxide nanotubes do not agree with those made of TiO2 crystals with either anatase or rutile phase. HRTEM observations revealed that the titanium oxide nanotubes usually have multiple shells, in analogy with multiwalled carbon nanotubes, but the shell spacing is about 0.75 nm which is much larger than that of the carbon nanotube, and the atomic structures of different shells are well correlated. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1423403
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