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  • 1
    Electronic Resource
    Electronic Resource
    Digital image processing for nonperiodic objects and an on-line image processing system for high resolution electron microscopy (1986)
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 4 (1986), S. 55-62 
    Details
    ISSN: 0741-0581
    Keywords: Autocorrelation ; Noise removal ; On-line image processing ; Diffractogram ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: A digital image processing method for noise removal and image enhancement in nonperiodic structural images is described. The method for noise removal uses a reversible transform between an image and image autocorrelation function. The Laplacian filter is then employed for image enhancement. Furthermore, an on-line image processing system for highresolution TEM is presented.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1060040106
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  • 2
    Electronic Resource
    Electronic Resource
    Measurement of electron probe beam diameter by digital image processing (1985)
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 2 (1985), S. 463-469 
    Details
    ISSN: 0741-0581
    Keywords: Electron probe beam diameter ; Digital image processing ; Acutance ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: The present report illustrates a computerized method for precise measurement of the diameter of an electron beam. The value of this measurement extends beyond simply providing an accurate estimate of resolution. Other salient areas which will benefit include quantitative X-ray microanalysis, energy loss spectroscopy, diffraction studies, and electron beam lithography. The biological sciences as well as the material sciences will gain enormously from improved accuracy in measurement (control) of beam diameter. It is anticipated that most or all of the mathematical manipulations outlined in this paper will be incorporated into digital electronic packages which will perform the functions automatically for setting the electron beam diameter to the scientist's choice. The purpose of the present report is to indicate some of the principles involved so that as electron microscopy becomes more computerized and automated, the user will have some understanding of what the electronics are doing rather than simply depressing a button or two and ignoring the power of what resides within the walls of the instrument.The performance of a scanning electron microscope (SEM) and a scanning transmission electron microscope (STEM) is roughly determined by the incident electron probe beam size (diameter) involving a sufficient electron current. In the present paper, the diameter of an ultrafine electron beam is measured indirectly from the information given by the blurring of an edge in a STEM or a SEM image of a crystalline specimen with fine, sharp edges. The obtained data were processed by digital image processing methods which give an accurate value of the beam diameter. For confirming the validity of this method, a suitable simulation based on the convolution theorem was performed. By using this measurement, we could measure the diameter of an ultrafine electron beam down to 2 nm, which could not be measured easily by previous techniques.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1060020508
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  • 3
    Electronic Resource
    Electronic Resource
    The conversion of a field-emission scanning electron microscope to a high-resolution, high-performance scanning transmission electron microscope, while maintaining original functions (1987)
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 6 (1987), S. 15-30 
    Details
    ISSN: 0741-0581
    Keywords: STEM ; On-line computer system ; Digital image processing ; Unstained biological specimen ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: Recently, the reliability of field-emission electron guns has increased. In addition, the cost of computer systems for on-line processing has dropped. Hence, we should now consider the use of scanning transmission electron microscopy (STEM) for routine work, especially, in the field of biology where one may expect to utilize digital image processing techniques.An STEM has been constructed, without disturbing the original functions, by converting a commercial scanning electron microscope equipped with a fieldemission gun. The STEM is generally operated at accelerating voltage 30 kV, focal length 7.5 mm, and beam current 1-2 × 10-10 A. Several improvements have been incorporated for removing the effects of vibration, contamination, and stray magnetic fields. Also, an adjustable detector aperture was utilized. The modified instrument was connected to an on-line digital image processing system for utilizing the information obtained from STEM images. The advantages of the modified system were studied from various viewpoints.
    Additional Material: 14 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1060060104
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  • 4
    Electronic Resource
    Electronic Resource
    Automatic measurement of scanning beam diameter using an on-line digital computer (1986)
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 3 (1986), S. 159-167 
    Details
    ISSN: 0741-0581
    Keywords: Electron probe beam diameter ; Digital image processing ; Online digital computer ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: A method for the measurement of electron probe beam diameter by digital image processing has recently been published. The purpose of the present report is to describe the development of an automatic system for beam diameter measurement. To complete this system, a method based on a theory which combines automation and high-resolution conditions is proposed. In practice, the beam diameter is measured from the STEM image of a crystalline hole in a gold thin film, utilizing an on-line computer system equipped with newly developed digital processing programs linked to a SEM in the transmission mode. The functions of the programs include statistical processing, matching, noise removal, interpolation, selection, and rotation. By combining these functions, the scanning beam diameter is accurately measured, in spite of difficulties, under most electron microscope operating conditions. The user simply appoints the edge included in the STEM image.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1060030204
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  • 5
    Electronic Resource
    Electronic Resource
    A comparison of on-line digital recording with conventional photographic recording for scanning electron microscopy (1986)
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 4 (1986), S. 157-161 
    Details
    ISSN: 0741-0581
    Keywords: Vibration ; Interpolation ; Signal averaging ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: The scanning electron microscope (SEM) has previously utilized a video monitor plus camera as the image recording system. However, this conventional method is inefficient in relation to information present in the original electric signal. Therefore, we propose, for general use, an on-line recording system consisting of an A-D converter, image memory, and computer. In addition, we found that the effect of vibration in the SEM image could be reduced by application of the digital recording system. In the present study, interpolation and signal averaging programs were utilized for confirming the performance level of the on-line recording system. These programs were found to be very effective for SEM.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1060040211
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  • 6
    Electronic Resource
    Electronic Resource
    An inexpensive and highly efficient device for observing a transmitted electron image in SEM (1987)
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 5 (1987), S. 51-58 
    Details
    ISSN: 0741-0581
    Keywords: STEM image ; SE yield ; Digital image processing ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: An inexpensive, efficient device that supplies a transmission mode to the conventional SEM has been developed. The transmitted electrons strike a metal plate, and these generate secondary electrons that are proportional to the quantity of the transmitted electrons. The generated electrons are collected by the secondary electron detector. Hence, the performance of this device is influenced by the number of secondary electrons generated in the metal plate. In order to construct a device that can attain the best transmitted electron image, the signal-to-noise ratio of images, obtained from various trial devices, were measured by a newly-developed digital image processing program. When the material and shape of the device are selected, to produce high-secondary emission, the efficiency of the device compares with that of a relatively expensive standard detector system (scintillator detector).
    Additional Material: 8 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1060050105
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  • 7
    Electronic Resource
    Electronic Resource
    Application of the Laplacian filter to high-resolution enhancement of SEM images (1984)
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 1 (1984), S. 331-340 
    Details
    ISSN: 0741-0581
    Keywords: Digital image processing ; Laplacin filter ; Scanning electron microscopy ; High-resolution ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: Certain digital image-processing methods, which are useful for nonperiodic structural images, have been applied to high-resolution SEM images for the improvement of resolution. Samples utilized in the present study consisted of magnetic tape coated with gold, T4 phage coated with gold-palladium, and uncoated specimens of Prolamellar body (PLB) in Cucurbita moschata. These images were blurred and otherwise disturbed by electronic noise, though the images were taken at the limit of efficiency of intrinsic instrument. The major image-processing tool was the Laplacian filter, which subtracts the Laplacian from the original image. Noise, which is a serious problem in digital processing of high-resolution SEM images, was suppressed by the nonlinear type smoothing method. Also, the noise was evaluated by an autocorrelation function and a power spectrum of the image. By using these methods of “deblurring” and noise removal, we achieved better resolution, and structural details of our biological specimens were revealed.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1060010403
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  • 8
    Electronic Resource
    Electronic Resource
    An image processing method for scanning electron microscopy based on the information transmission theory (1985)
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 2 (1985), S. 73-87 
    Details
    ISSN: 0741-0581
    Keywords: Response function ; Gradient ; Acutance ; Laplacian ; Edge sharpening ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: Based on the information transmission theory, topographic image signals in scanning electron microscopy are used to evaluate contrast, gradient, acutance, and Laplacian operator, the total of which represent the image sharpness of an edge line.One may consider the impulse and step functions as an input to the Gaussian system function of a low-pass filter, the impulse and step response functions possibly representing a single spot and image contrast of an edge profile, respectively. It is shown that the response function of acutance defined as the power of the gradient normalized by density is a more realistic representation of image edge sharpness. Also, edge sharpness can be greatly enhanced by utilizing the Laplacian operator through digital image processing for a disk specimen model with a rounded edge.Contrast increased by specimen tilt, and an edge effect due to side-scattered electrons, as well as the signal attenuation by specimen collection, are consistently obtained as the response function in the system.The exact measurement of spot size and edge-to-edge resolution, and image sharpness improvement, are derived by digital image processing.
    Additional Material: 12 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1060020202
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  • 9
    Electronic Resource
    Electronic Resource
    A method of noise removal using the inverse transform of an image autocorrelation function (1985)
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 2 (1985), S. 431-438 
    Details
    ISSN: 0741-0581
    Keywords: Image autocorrelation function ; Reversible transform ; Noise autocorrelation radius ; Noise removal ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: A method for a reversible transform between an image and image autocorrelation function has been devised, and it has been applied to the reduction of random noise in a microscope image. Object-related features of an image signal as well as noise features are overlapped at the vicinity of the origin of an image autocorrelation, and a peak is formed at this position. The present method removes the noise contribution in this peak and returns the autocorrelation function, thus corrected, to the image. An autocorrelation function is computed by two Fourier transforms as based on the convolution theorem. The inverse transform from the image autocorrelation function is made possible by performing two Fourier transforms in reverse to the above. This method has been developed to remove random noise more accurately from a single image (especially for nonperiodic images) than other image-processing methods such as smoothing techniques and low pass filtering.
    Additional Material: 3 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1060020504
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  • 10
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    PM-18 Technology for fundamentally improving an extremely low-quality video signal used for fine focusing and astigmatism correction in scanning electron microscopy (2019)
    Oxford University Press
    Details
    Publication Date: 2019-11-01
    Print ISSN: 2050-5698
    Electronic ISSN: 2050-5701
    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
    Published by Oxford University Press on behalf of Japanese Society of Microscopy.
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