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  • 1
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    Electron Densitometer for Irradiation Studies in Electron Microscope (1966)
    American Institute of Physics
    Details
    Publication Date: 1966-08-01
    Print ISSN: 0034-6748
    Electronic ISSN: 1089-7623
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Published by American Institute of Physics
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    PAPER CURRENT
  • 2
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    Periodic heat flow in a hollow cylinder rotating in a furnace with a viewing port (1963)
    In:  CASI
    Details
    Publication Date: 2009-12-28
    Description: Rotating-specimen furnace for use in determining spectral & total emittance of materials from measurement of radiant flux from specimen surface
    Keywords: GEOPHYSICS
    Type: Measurement of Thermal Radiation Properties of Solids; NASA-SP-31
    Format: text
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    NASA TECHNICAL REPORTS
  • 3
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    Effects of surface contamination on the infrared emissivity and visible-light scattering of highly reflective surfaces at cryogenic temperatures (1972)
    In:  CASI
    Details
    Publication Date: 2005-11-30
    Description: A technique is described for the simultaneous in situ measurement of film thickness, refractive index, total normal emissivity, visible light scattering, and reflectance of contaminant films on a highly reflective liquid nitrogen-cooled, stainless steel substrate. Emissivities and scattering data were obtained for films of water, carbon dioxide, silicone oil, and a number of aromatic and aliphatic hydrocarbons as a function of film thickness between zero and 20 microns. Water had the greatest effect on emissivity, followed by silicone oil, aliphatic hydrocarbons, aromatic hydrocarbons, and carbon dioxide. Emissivity increased more rapidly with film thickness between zero and 2.5 microns, than at thickness greater than 2.5 microns. Scattering of visible light changed little below 2-microns thickness but increased rapidly with thickness beyond 2 to 3 microns. The effect of contaminant films on passive radiation coolers is discussed.
    Keywords: PHYSICS, GENERAL
    Type: Space Simulation; p 489-502
    Format: text
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    NASA TECHNICAL REPORTS
  • 4
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    Failure problem with a rhenium mass spectrometer filament and its solution (1963)
    In:  CASI
    Details
    Publication Date: 2006-10-26
    Description: Failure analysis for rhenium mass spectrometer filaments in atmospheric structure satellite
    Keywords: INSTRUMENTATION AND PHOTOGRAPHY
    Format: text
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    NASA TECHNICAL REPORTS
  • 5
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    Effect of simulated space radiation on selected optical materials. (1972)
    In:  Other Sources
    Details
    Publication Date: 2011-08-16
    Description: The effect of simulated Nimbus spacecraft orbital (1100 km, circular, and polar) radiation on wide-band-pass glass filters, narrow-bandpass thin-film interference filters, and several fused silicas was determined by transmittance measurements over the 200-3400-nm wavelength region. No changes were observed in the filters, which were shielded with fused silica during irradiation, after exposure to a 1-yr equivalent orbital dose of electrons, nor were changes observed in the fused silicas after the same electron exposure plus a 1-yr equivalent dose of protons. Exposure to a 1/2-yr equivalent dose of solar uv radiation, however, caused a significant degradation in the transmittance of two uv-transmitting interference filters but had no effect on two colored glass filters that transmitted in the visible and near-ir regions. As a result of the uv exposure, the fused silicas exhibited losses of several percent over the 200-300-nm wavelength region.
    Keywords: PHYSICS, GENERAL
    Type: Applied Optics; 11; June 197
    Format: text
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    NASA TECHNICAL REPORTS
  • 6
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    Photomultiplier window materials under electron irradiation - Fluorescence and phosphorescence (1975)
    In:  Other Sources
    Details
    Publication Date: 2011-08-16
    Description: The fluorescence and phosphorescence of photomultiplier window materials under electron irradiation have been investigated using a Sr-90/Y-90 beta emitter as the electron source. Spectral emission curves of UV-grade, optical-grade, and electron-irradiated samples of MgF2 and LiF, and of CaF2, BaF2, sapphire, fused silica, and UV-transmitting glasses were obtained over the 200-650-nm spectral range. Fluorescence yields were determined on these materials utilizing photomultiplier tubes with cesium telluride, bialkali, and trialkali (S-20) photocathodes, respectively. Optical-grade MgF2 and LiF, as well as electron-irradiated UV-grade samples of these two materials, show enhanced fluorescence due to color-center formation and associated emission bands in the blue and red wavelength regions. Large variations in fluorescence intensities were found in UV-grade sapphire samples of different origins, particularly in the red end of the spectrum, presumably due to various amounts of chromium-ion content. Phosphorescence decay with time is best described by a sum of exponential terms, with time constants ranging from a few minutes to several days.
    Keywords: OPTICS
    Type: Applied Optics; 14; Sept
    Format: text
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    NASA TECHNICAL REPORTS
  • 7
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    Influence of Copper Ions on Adherence of Vitreous Coatings to Stainless Steel (1956)
    In:  CASI
    Details
    Publication Date: 2019-06-28
    Type: NACA-TN-3679
    Format: application/pdf
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    NASA TECHNICAL REPORTS
  • 8
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    Effect of Oxygen Content of Furnace Atmosphere on Adherence of Vitreous Coatings to Iron (1955)
    In:  CASI
    Details
    Publication Date: 2019-06-28
    Type: NACA-TN-3297
    Format: application/pdf
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    NASA TECHNICAL REPORTS
  • 9
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    Effects of simulated space radiation on selected optical materials (1972)
    In:  CASI
    Details
    Publication Date: 2019-06-27
    Description: The effect of simulated Nimbus spacecraft orbital (1100 km, circular, and polar) radiation on wide bandpass glass filters, narrow bandpass thin film interference filters, and several fused silicas was determined by transmittance measurements over the 200 to 3400 nanom wavelength region. No changes were observed in the filters, which were shielded with fused silica during irradiation, after exposure to a 1-year equivalent orbital dose of electrons, nor in the fused silicas after the same electron exposure plus a 1-year equivalent dose of protons. Exposure to a 1/2-year equivalent dose of solar ultraviolet radiation caused a significant degradation in the transmittance of two ultraviolet-transmitting interference filters but had no effect on two colored glass filters that transmitted in the visible and near infrared regions. As a result of the ultraviolet exposure the fused silicas exhibited losses of several percent over the 200- to 300 nanom wavelength region.
    Keywords: SPACE RADIATION
    Type: NASA-TN-D-6758 , G-1056
    Format: application/pdf
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    NASA TECHNICAL REPORTS
  • 10
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    Noise limitations of multiplier phototubes in the radiation environment of space (1976)
    In:  CASI
    Details
    Publication Date: 2019-06-27
    Description: The contributions of Cerenkov emission, luminescence, secondary electron emission, and bremsstrahlung to radiation-induced data current and noise of multiplier phototubes were analyzed quantitatively. Fluorescence and Cerenkov emission in the tube window are the major contributors and can quantitatively account for dark count levels observed in orbit. Radiation-induced noise can be minimized by shielding, tube selection, and mode of operation. Optical decoupling of windows and cathode (side-window tubes) leads to further reduction of radiation-induced dark counts, as does reducing the window thickness and effective cathode area, and selection of window/cathode combinations of low fluorescence efficiency. In trapped radiation-free regions of near-earth orbits and in free space, Cerenkov emission by relativistic particles contributes predominantly to the photoelectron yield per event. Operating multiplier phototubes in the photon (pulse) counting mode will discriminate against these large pulses and substantially reduce the dark count and noise to levels determined by fluorescence.
    Keywords: OPTICS
    Type: NASA-TN-D-8147 , G-7632
    Format: application/pdf
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    NASA TECHNICAL REPORTS
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