ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A set of fast algorithms for axisymmetric drop shape analysis measurements is described. Speed has been improved by more than 1 order of magnitude over previously available procedures. Frame analysis is performed and drop characteristics and interfacial tension γ are computed in less than 40 ms on a Pentium III 450 MHz PC, while preserving an overall accuracy in Δγ/γ close to 1×10−4. A new procedure is described to evaluate both the algorithms performance and the contribution of each source of experimental error to the overall measurement accuracy. © 2001 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1364666
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