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  • 1
    facet.materialart.
    Unknown
    In:  CASI
    Publication Date: 2019-08-28
    Description: Technical information on developments in instrumentation is arranged into four sections: (1) instrumentation for analysis; (2) analysis of matter; (3) analysis of electrical and mechanical phenomena; and (4) structural analysis. Patent information for two of the instruments described is presented.
    Keywords: INSTRUMENTATION AND PHOTOGRAPHY
    Type: NASA-SP-5957(02)
    Format: application/pdf
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