Publication Date:
2019-08-28
Description:
Technical information on developments in instrumentation is arranged into four sections: (1) instrumentation for analysis; (2) analysis of matter; (3) analysis of electrical and mechanical phenomena; and (4) structural analysis. Patent information for two of the instruments described is presented.
Keywords:
INSTRUMENTATION AND PHOTOGRAPHY
Type:
NASA-SP-5957(02)
Format:
application/pdf