ISSN:
1525-1314
Source:
Blackwell Publishing Journal Backfiles 1879-2005
Topics:
Geosciences
Notes:
Clay mineral crystallinity and crystallite (domain) size data determined by X-ray diffraction (XRD) are methods extensively used in the characterization of very low-grade metamorphic conditions. However, the lack of sufficient interlaboratory standardization has made comparisons between different research groups unreliable due to significant variations in numerical results obtained, a consequence of the different machine conditions, measurement methods and sample preparations used during analysis. A calibration approach to the standardization of data using rock chip standards is presented, which allows data sets produced by different research groups to be directly and quantitatively compared. A standardized scale, the crystallinity index standard (CIS), is proposed, with illite crystallinity anchizonal boundary limits of 0.25d̀Δ2θ and 0.42d̀Δ2θ, and equivalent illite crystallite sizes of 52 and 23 nm, respectively, determined by the Warren-Averbach method. Calibrating both old and new data will enable more reliable comparisons between similar and contrasting geological environments, and should improve the accuracy and reliability of correlations made between XRD data and other indicators of very low-grade metamorphism, hence increasing the value of such clay mineral studies.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1111/j.1525-1314.1994.tb00010.x
