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    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 73 (2002), S. 638-640 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: An updated and more accurate database for single- and double-ionization cross sections for almost all argon ions has been developed for the modeling of the charge state distribution (CSD) within an electron cyclotron resonance ion source. When the highly non-Maxwellian anisotropic electron-distribution function, is modeled by a Fokker–Planck code, one has to use the ionization cross sections instead of the Maxwellian rate coefficients. Most of the fitting coefficients used within the well-established semi-empirical formulas for direct ionization and double ionization have been recalculated using more accurate crossed-beam experimental data available. The shift of the CSD to higher-charge states due to the contribution of excitation autoionization and double ionization is presented by comparing the GEM code modeling using the Lotz formula and the cross sections with updated fitting coefficients. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
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