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Influence of substrate structure on the growth of CdTe thin films (2001)

Yan, Y. ; Dhere, R. G. ; Jones, K. M. ; [et al.]

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 89 (2001), S. 5944-5948

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ISSN: 1089-7550

Source: AIP Digital Archive

Topics: Physics

Notes: We report on a high-resolution transmission electron microscopy and energy-dispersive x-ray spectroscopy study of the microstructure of CdTe thin films epitaxially grown on single-crystal hexagonal CdS and cubic CdTe substrates. We find that the different structures of the substrates do not make a great structural difference on the grown CdTe films; i.e., on both substrates, the grown CdTe films have a cubic structure and high density of planar defects near the interface regions. At the CdTe/CdS interface, interdiffusion occurs, forming CdTe1−xSx and CdS1−xTex alloys. These alloys lead to significantly reduced mismatch at the interface.© 2001 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1367406

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