Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
73 (1998), S. 3450-3452
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
The microwave field dependence of the surface resistance for YBa2Cu3O7−δ films was studied at field levels up to 400 A/m. The c-axis normal YBa2Cu3O7−δ films were deposited onto copper disks 36 mm in diameter by a laser ablation method. The surface resistance increased linearly below 50 K as the microwave magnetic field increased, which is explained better by the critical-state model than by the coupled-grain model. The critical current density decreased almost linearly with increasing temperature from 2.8×105 A/cm2 at 20 K to 4×104 A/cm2 at 77 K. © 1998 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.122793
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