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Measurement of anisotropic diffuse scattering with synchrotron radiation (1990)

Rosshirt, E. ; Frey, F. ; Kupcik, V. ; [et al.]

Copenhagen : International Union of Crystallography (IUCr)

Applied crystallography online 23 (1990), S. 21-25

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ISSN: 1600-5767

Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001

Topics: Geosciences , Physics

Notes: Anisotropic diffuse scattering of the one-dimensional conductor K-hollandite has been measured at a synchrotron source and compared with measurements with a rotating anode. The intensity gain of more than one order of magnitude and the ability to adjust the wavelength provide the counting statistics in a few hours that are necessary for a quantitative analysis of diffuse phenomena. The main advantage of a synchrotron source is the high resolution throughout reciprocal space (low and high Q). Thus, commensurate/incommensurate positions of diffuse layers may be distinguished, weak diffuse maxima become detectable and small peak shifts of diffuse modulations clearly visible. Correlation functions may be determined directly from the diffuse profiles without tedious resolution corrections. These features are essential for a dedicated instrument at a storage ring.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1107/S0021889889010514

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