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Use of kinematical diffraction in X-ray topography (1985)

Alexandropoulos, N. G. ; Kotsis, K. T.

Copenhagen : International Union of Crystallography (IUCr)

Applied crystallography online 18 (1985), S. 509-512

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ISSN: 1600-5767

Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001

Topics: Geosciences , Physics

Notes: A new X-ray topographic method is proposed that makes use of the kinematical diffraction component, which is significantly more sensitive to the crystal-surface imperfections than dynamical Laue–Bragg diffraction. The sensitivity of the method has been studied using a triple crystal diffractometer to separate kinematical and dynamical components of the diffraction intensity curve when the Bragg condition is nearly satisfied.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1107/S0021889885010792

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