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  • 1
    Electronic Resource
    Electronic Resource
    Alignment of double-crystal diffractometers (1985)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 18 (1985), S. 334-338 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A rapid method is described for aligning a double-crystal diffractometer based on the design of Hart (Characterization of Crystal Growth Defects by X-ray Methods, edited by Tanner & Bowen, pp. 483–485. Plenum Press, London, 1980). The theoretical intensity profiles are derived for variations in crystal tilt and rotation, and a method is described that uses these profiles to align any double-crystal diffractometer in a systematic way, suitable for computer automation. The alignment requirements for simple mismatch measurements are also given.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S002188988501041X
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