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Appareil de microdéformation à chaud pour topographie aux rayons X. Application à des bicristaux de germanium (1980)

Debrenne, P. ; Mathiot, A. ; de Tournemine, R.

Copenhagen : International Union of Crystallography (IUCr)

Applied crystallography online 13 (1980), S. 88-92

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ISSN: 1600-5767

Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001

Topics: Geosciences , Physics

Notes: The device described here has been designed to perform microcreep experiments and, simultaneously, to get X-ray topographic images of the sample. Such dynamic experiments are now possible with white synchrotron radiation (LURE-DCI Orsay). The sample material, germanium, is hard to machine; so a simple shape was chosen (rectangular platelet 20 × 5 × 0–2 mm). The grip system is quite simple and the whole assembly is compact enough to be adapted to fit a standard goniometer head. Temperatures as high as 923 K in air and forces up to few tens of Newtons can be reached. The first experiments on Ge bicrystals have shown the device to perform as expected.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1107/S0021889880011545

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