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  • 1
    Electronic Resource
    Electronic Resource
    The significance of texture parameters in phase analysis by X-ray diffraction (1969)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 2 (1969), S. 176-180 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The theory of the direct comparison X-ray method of phase analysis is extended to correct for preferred orientation effects. Texture parameters are defined to assess the type and intensity of preferred orientation using data from diffractometer patterns. The analysis is illustrated with results obtained on three austenitic stainless steels.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889869006881
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