Electronic Resource
Chichester [u.a.]
:
Wiley-Blackwell
International Journal of Numerical Modelling: Electronic Networks, Devices and Fields
2 (1989), S. 117-129
ISSN:
0894-3370
Keywords:
Engineering
;
Electrical and Electronics Engineering
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Electrical Engineering, Measurement and Control Technology
Notes:
The response of capacitive array sensors in the presence of flawed solid materials is simulated using finite elements and infinite elements with exponential decay. Conventional finite elements are used to model the critical regions near the probe and the surface of the solid. Infinite elements are used to represent the farfield conditions of the space surrounding the probe and the solid. The method is first applied to problems with analytic solutions to determine the accuracy of the results obtained using the infinite elements. The response of a capacitive array sensor is then simulated using a line integral which measures the relative change in admittance between flawed and unflawed solids. Examples of capacitive probe responses are given for several parametric variations of the flaw size and dielectric constant of the solid.
Additional Material:
13 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/jnm.1660020303
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