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  • 1
    Electronic Resource
    Electronic Resource
    Chichester, West Sussex : Wiley-Blackwell
    Mathematical Methods in the Applied Sciences 19 (1996), S. 401-424 
    ISSN: 0170-4214
    Keywords: Engineering ; Numerical Methods and Modeling
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Mathematics
    Notes: The quasi-hydrodynamic carrier transport equations for semiconductors extended to Fermi-Dirac statistics are considered. It is shown that in the high injection case, these equations reduce to a drift-diffusion model with non-linear diffusion terms. The limiting procedure is proved rigorously and error estimates are shown. We compute numerically static voltage-current characteristics of a forward biased pn-junction diode and compare the curves with the corresponding characteristics obtained from the standard drift-diffusion model based on Boltzmann statistics. It turns out that there exists a so-called threshold voltage at which the behaviour of the characteristic changes. Under high injection conditions, the dependence of the current on the bias appears to be approximately polynomial. The characteristics are studied analytically for a unipolar device.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
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