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  • 1
    Electronic Resource
    Electronic Resource
    Weinheim : Wiley-Blackwell
    Particle and Particle Systems Characterization 1 (1984), S. 53-58 
    ISSN: 0934-0866
    Keywords: Chemistry ; Industrial Chemistry and Chemical Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Process Engineering, Biotechnology, Nutrition Technology
    Notes: When performing particle size analysis by scattered light, coincidences in the measuring volume of optical particle counters not only cause too small a particle concentration to be measured, but also a size distribution to be obtained which is systematically shifted towards coarser particle sizes. It is pointed out in this paper how this shift can be precalculated when the true distribution is given. The results show under which conditions a correction of the measured distribution is indispensable.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
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