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Near-field optical-scanning microscopy (1986)

Dürig, U. ; Pohl, D. W. ; Rohner, F.

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 59 (1986), S. 3318-3327

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ISSN: 1089-7550

Source: AIP Digital Archive

Topics: Physics

Notes: Near-field optical-scanning (NFOS) microscopy or "optical stethoscopy'' provides images with resolution in the 20-nm range, i.e., a very small fraction of an optical wavelength. Scan images of metal films with fine structures presented in this paper convincingly demonstrate this resolution capability. Design of an NFOS microscope with tunnel distance regulation, its theoretical background, application potential, and limitations are discussed.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.336848

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