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Interaction force detection in scanning probe microscopy: Methods and applications (1992)

Dürig, U. ; Züger, O. ; Stalder, A.

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 72 (1992), S. 1778-1798

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ISSN: 1089-7550

Source: AIP Digital Archive

Topics: Physics

Notes: Fundamental aspects of interaction force detection and force microscopy are discussed. A formalism is developed for studying the dynamics of experimental setups in general terms. The analysis focuses on stability criteria and resonant properties of the force sensor. The latter are important for measuring interaction force gradients. Experimental techniques used for interaction force detection are examined in detail. Finally, experimental results are presented that demonstrate the potential of combining atomic scale interaction force detection with scanning tunneling microscopy.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.352348

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