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X-ray diffraction method for measurement of elastic strain (1970)

Hnilicka, M. ; Fiedler, R.

Copenhagen : International Union of Crystallography (IUCr)

Applied crystallography online 3 (1970), S. 110-112

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ISSN: 1600-5767

Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001

Topics: Geosciences , Physics

Notes: A method is suggested, using diffraction line displacements, to facilitate simultaneous determination of one-dimensional strain in a particular direction in the surface of a polycrystalline material and of the lattice parameter corresponding to the unstressed state. A single exposure at perpendicular incidence of the primary X-ray beam enables both values to be obtained. Full advantage is taken of the ratios of diffraction ring diameters.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1107/S0021889870005782

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