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  • Articles  (287)
  • Analytical Chemistry and Spectroscopy  (287)
  • 1970-1974  (287)
  • Physics  (287)
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  • Articles  (287)
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  • 1
    Electronic Resource
    Electronic Resource
    Masthead (1972)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 1 (1972) 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300010101
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  • 2
    Electronic Resource
    Electronic Resource
    Editorial (1972)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 1 (1972), S. 1-1 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300010102
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  • 3
    Electronic Resource
    Electronic Resource
    An evaluation of the suitability of X-ray fluorescence spectroscopy in the analysis of complex alloy systems (1972)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 1 (1972), S. 3-14 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: An attempt has been made to evaluate on the basis of simple physical theories the principal possibilities and limitations of the X-ray fluorescence method in determining both principal components and other alloying elements as well as impurities in relatively complex alloy systems. The text refers specifically to the analysis of copper-based alloys, but the principles are general ones and the arguments can easily be applied to other systems.
    Additional Material: 19 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300010103
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  • 4
    Electronic Resource
    Electronic Resource
    Analogien zwischen der Röntgenstreuanalyse und der RöntgenfluoreszenzanalyseHerrn Prof. Dr. F. Lihl zum 65 Geburtstag gewidmet. (1972)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 1 (1972), S. 15-21 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Description / Table of Contents: The equations for primary, secondary and tertiary excitation in XRFA have been modified in order to describe single- and multiple-scattering processes in XRSA. For different hydrocarbons, the corresponding ratios of coherently and incoherently scattered X-rays have been calculated and the reasons for the discrepancy of approximately 15 per cent between theory and experiment discussed.
    Notes: Es werden die Gleichungen fur die Primä, Sekundär- und Tertiäranregung bei der RFA verwendet, um aus Analogiebetrachtungen die Verhältnisse bei der Einfach-, Zweifach- und Dreifachstreuung quantitativ behandeln zu können. Der charakteristische Quotient aus körent und inkohärent gestreuter Intensität wird sodann fur verschiedene Kohlenwasserstoffe berechnet und mit den experimentell gefundenen verglichen. Die Ursachen für den etwa 15 Prozent betragenden Unterschied werden diskutiert.
    Additional Material: 2 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300010104
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  • 5
    Electronic Resource
    Electronic Resource
    Some applications of a computer program for quantitative spectrochemical analysis (1972)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 1 (1972), S. 29-35 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: In the general application of the X-ray spectrographic method, it is often difficult to obtain standards which closely approximate the unknown being analysed. One of the possible ways around this problem is to utilise a matrix correction procedure which does not, in principle, require large numbers of standard samples. One such method has been described by Birks and Criss and this paper describes the application of their program at the University of Florida where a wide variety of samples are encountered. Also discussed in the paper is the basis of the so-called ‘Fundamental Parameter’ method which has provided the means of analysing with great accuracy certain binary and tertiary alloys. It seems that the method holds considerable promise for the analysis of ore deposits and the prediction of inter-element effects.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300010106
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  • 6
    Electronic Resource
    Electronic Resource
    Recent developments in analysing crystals for X-ray spectrometry (1972)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 1 (1972), S. 23-28 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The usefulness of the analysing crystal is generally governed by its angular dispersion and reflecting power. This is particularly so today where the increasing requirement for more speed and greater accuracy can often only be obtained by the availability of higher net intensities. Although the performance of the conventional X-ray spectrometer is satisfactory in the middle portion of the wavelength range, it lacks dispersion at the short wavelength end and sensitivity at the long wavelength end. For this reason, there is a continuing search for crystals which offer more angular dispersion in the 0.2 to 2 Å range and better reflecting power in the 5 to 20 Å region.This paper discusses results obtained with some of the newer analysing crystals which have become available during the past couple of years. These crystals include pyrolitic graphite, rubidium acid phthalate, sorbitol hexa-acetate, and the (420) and the (422) cuts of lithium fluoride.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300010105
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  • 7
    Electronic Resource
    Electronic Resource
    An element-specific X-ray fluorescence scanner for thin-layer chromatograms (1972)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 1 (1972), S. 37-38 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: An instrument is described which permits thin-layer chromatograms to be scanned in a commercial X-ray fluorescence spectrometer. The detection of phosphorus, sulphur, chlorine and iodine has been investigated, but the application of the instrument is not restricted to these elements, for which lower limits of detection of about 2 μg were found.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300010107
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  • 8
    Electronic Resource
    Electronic Resource
    A die for pelletizing samples for X-ray fluorescence analysisB. P. Fabbi, U.S. Geol. Survey Prof. Paper 700B, B187 (1970). (1972)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 1 (1972), S. 39-41 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The preparation of pellets of powdered geological samples is a critical step in X-ray fluorescence analysis. A special die has been designed to produce smooth surfaces on extremely durable pellets and to provide a protective, hard outer ring and backing. The outer ring minimises the deterioration of the edge that has in the past limited the usable life of the pellet. Repetitive preparations have shown reproducibility and homogeneity to be within normal counting statistics.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300010108
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  • 9
    Electronic Resource
    Electronic Resource
    The Denver X-ray Conference, Denver, Colarado, U.S.A. August 11-13th, 1971 (1972)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 1 (1972), S. 45-45 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300010110
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  • 10
    Electronic Resource
    Electronic Resource
    Notes and comments: The training of X-ray spectroscopists (1972)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 1 (1972), S. 43-44 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: One of the current problems in the application of the X-ray spectrometer is the training of operators in the use of instrumentation and techniques. One of the usual consequences of rapid expansion in the use of any instrumental procedure is the lack of general experience and expertise, and in this X-ray spectrometry is no exception. As a technique it has only recently been introduced into the syllabus of the appropriate university course of study and, at the present time, this only at a very few universities. Training in X-ray spectrometry has therefore become very much an extra-mural course of study and among the more successful groups to offer courses in the U.S.A. has been the State University of New York at Albany. The following short report by Professor Chessin gives an informal description of the background of his ‘Clinics’ and describes some of his experiences.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300010109
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