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  • Engineering  (2,531)
  • 1985-1989  (2,531)
  • 1
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988), S. 115-128 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: An absorbing boundary condition for simple layered media is presented. The method enables the modelling of open space radiation and scattering problems when the source (or scatterer) and a plane interface between two media are both located within the finite-difference or finite-element region. The projection operator method is used to take into account the presence of reflected waves at the media interface. The derivation of the projection operator is presented for one, two and three dimensions. Examples of electromagnetic radiation and scattering in two dimensions are presented to illustrate the numerical implementation and validity of the new absorbing boundary condition.
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  • 2
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988), S. 129-130 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
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  • 3
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988), S. 131-136 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: A design method for filters having duobinary signal pulses as impulse response is presented.
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  • 4
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988), S. 137-151 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
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  • 5
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988), S. 153-164 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Spontaneous emission noise power, although small in magnitude, affects many aspects of the semiconductor laser's operation. An accurate model has been developed for it for use in the transmission-line laser model (TLLM), which is a time-domain, wideband, dynamic, non-adiabatic semiconductor laser model. The effects of approximations used in other dynamic laser models are then investigated by comparison with the results from the TLLM. The study shows that the representation of this noise power has an important bearing on the damping of modelled transient oscillations.
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  • 6
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988), S. 171-171 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
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  • 7
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988), S. 165-170 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: A method for analysing the electrical effect of a set of conducting strips is presented. This method is applied to modelling the electrical behaviour of conducting tracks on a printed circuit board (PCB). Unlike most other published work, this analysis is not restricted to the case where the tracks are parallel. The problem is formulated in terms of an admittance matrix. A boundary element method incorporating image theory is used to produce a system of linear equations. These are solved to yield the required admittance matrix, which can then be incorporated into a standard circuit analysis package. Comparisons between measured and predicted circuit performance for a complex layout show close agreement up to at least 1 GHz.
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  • 8
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989) 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
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  • 9
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988), S. 173-174 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
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  • 10
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988), S. 175-188 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: The asymptotic form, for high frequencies, of the equations of propagation on a nonuniform N-conductor transmission line is considered. Under the assumption of perfect conditions in uniform, isotropic media, all N propagation velocities are the same, but the characteristic impedance matrix is allowed to vary with position along the line. Closed-form solutions are obtained for some cases of interest.
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  • 11
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989) 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
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  • 12
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 1-15 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: In order to develop a new kind of filter that makes a compromise between quasi-optical and more traditional bandpass filtering techniques at millimetre wavelengths, a theoretical modelling of grids in oversize and monomodal waveguides is performed using a variational method.
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  • 13
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 31-52 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: A novel procedure for the numerical modelling of current transport in semiconductor devices is presented. The method is based on high-order trigonometric expansions (Fourier series) of the solution. The expansion coefficients are calculated in a Galerkin-type algorithm. The method offers infinite-order accuracy regardless of the number of spatial dimensions of the model. Well-conditioning and diagonal dominance of the discrete equations render the numerical procedure stable and effective. Significant advantages are expected, particularly for the solution of strongly non-linear multidimensional device models. Properties of the algorithm are demonstrated on standard semiconductor devices.
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  • 14
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 227-240 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: The coupling between incident electromagnetic fields and lossless, multimode, multiconductor, transmission systems is studied using transmission-line modelling (TLM). Model predictions compared well with experimental multimode results. The model presented is suitable for studying electromagnetic compatibility problems in the time-domain.
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  • 15
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 280-280 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
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  • 16
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988), S. 19-30 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: The Boltzmann transport equation is used to derive a set of conservation equations which is capable of describing the electron transport phenomena in a single-valley semiconductor. These conservation equations are averaged over the different valleys of the conduction band to develop another set of equations that can be used to describe accurately the electron transport phenomena in a multi-valley semiconductor, such as GaAs, using the equivalent single-electron gas model whose characteristics are the average weighted characteristics of the constituent gases. The nonstationary effects are included by using energy dependent mobility and electron temperature functions. This program is used to simulate a GaAs MESFET with a 0·5 μm gate length and a 0.2 μm thick active layer. The active layer is doped at 1017 cm-3. A travelling Gunn domain is observed between the gate and the drain. The domain oscillation frequency is much higher than the normal operating frequency of the MESFET. The domain formation's dependence on the gate bias and the active layer thickness are also presented.
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  • 17
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988) 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
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  • 18
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988), S. 61-70 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Two- and three-dimensional electromagnetic resonance calculations have been performed on rising-sun magnetron structures. These calculations have been made using the transmission-line matrix method. Cylindrical coordinates have been used in order to facilitate modelling of the essentially cylindrical device. Recent improvements to the TLM technique, such as the development of the symmetric condensed node for electromagnetics, have been fully exploited. The numerical procedure is described, the modelling process is discussed, and the results obtained are evaluated in comparisons with corresponding empirical data.
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  • 19
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988), S. 45-59 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: The conventional transverse resonance method, which has been widely used for the approximate characterization of a number of guiding structures and leaky wave antennas, is formulated in a generalized form. The transverse resonance viewpoint combined with the generalized matrix representation of discontinuities yields a rigorous transverse equivalent circuit of the guiding structure.This technique is used to compute the characteristics of both symmetrical and asymmetrical double slot unilateral finlines in terms of phase constant and characteristic impedance of the dominant as well as higher-order modes. Numerical aspects of this method are discussed.In a double-slot finline structure, a coupled-mode regime is established with the onset of the first higher-order mode in addition to the dominant quasi-TEM mode. Symmetrical structures are simply modelled in terms of even and odd mode characteristics, but a more general coupled-line model, in terms of the C-mode and the II-mode must be applied to asymmetrical coupled finlines.
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  • 20
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988), S. 71-72 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
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  • 21
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988), S. 85-91 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Transmission-line models (TLMs) for nonlinear reactive components and mutual inductances are derived. The model for nonlinear reactive components is shown to be an improvement on the previous one. TLM results with the mutual inductance model are compared with the exact solution, and good agreement is found.
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  • 22
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988), S. 189-206 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: A numerical method using impulse analysis of a transmission-line matrix is used to model the scattering of underwater acoustic waves. The method is demonstrated by observation of plane and curved wavefronts travelling through the medium, and by plane wavefronts being scattered by a reflecting boundary.
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  • 23
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988), S. 207-220 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Shooting and bouncing rays (SBR) is a numerical method based on geometric optics developed to compute the electromagnetic scattering from jet inlets and partially open cavity structures. This method is used to study the effects of shaping on the radar cross-section (RCS) of cavities. Two cylindrical cavity structures are analysed: one with a uniform circular cross-section, and the other with a non-uniform cross-section varying from a triangular shape to a circular shape. By bending the longitudinal axis of a cylindrical cavity, a significant reduction in RCS at near axial incidence can be achieved.
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  • 24
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988) 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
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  • 25
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988), S. 1-1 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
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  • 26
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988), S. 7-17 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: The principal features of the modified TLM method such as the asymmetrical condensed node, graded mesh and dispersion characteristics, are briefly presented. Its general application to multiaxial discontinuities in quasi-planar structures is described, and the modelling of bilateral finline T-junctions is demonstrated in particular.
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  • 27
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 17-29 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: The nature and significance of time-domain approximations needed for a diakoptic solution using transmission-line modelling (TLM) are examined. Truncation, filtering and repeated convolution of time responses result in severe restrictions in the accuracy of time-domain diakoptics. The frequency-domain diakoptic method has several advantages, including speed and simplicity, and warrants further study.
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  • 28
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989) 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
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  • 29
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    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 81-92 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: A de model for short-channel MOSFETs is presented in this paper. Several second-order effects associated with small-geometry MOSFETs such as mobility degradation, carrier velocity saturation and channel length modulation are included in the model. The analysis emphasizes the modeling of the output conductance and the transconductance which are important in analogue circuit simulation. The theoretical predictions of the model are in good agreement with the experimental data available in the literature.
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  • 30
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    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 75-80 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: A simulation of power transformers following switching operations is presented in which each core section is represented by a non-linear inductance, the differential inductance being determined from the flux density in that section of the core. In analysing the resultant circuit model for the transformer it is shown that the circuit equations have dyadic properties which can be used to give a more efficient numerical solution.
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  • 31
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    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 93-102 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: An approach, based on the finite element method (FEM), is used for evaluating the electromagnetic field distribution in a class of E-plane metal insert filters, operating in the Ka-band. Artificial boundary conditions are inserted directly in a functional, enabling a solution of the scalar wave equation by finite element method.The scattering parameters of the filter, the electromagnetic field and, therefore, the current distributions on the thin metal inserts are computed. Then, the power dissipated in the metallic septa, which is one of the major limitations for the maximum CW-power that can be handled by these types of filter, is evaluated using a perturbational approach. Finally, the maximum field intensity is determined, allowing an estimate of the maximum peak power that these structures can handle.
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  • 32
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    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 103-111 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: The multigrid technique, which is mainly used in the finite difference method, is applied to the TLM (transmission-line matrix or modeling) procedure. In the multigrid TLM, the field region is covered with sets of regular transmission-line matrices of different mesh sizes. The finer grid pattern, which overlaps the coarser grid, fills the region with high field gradients. Data obtained in the coarser grid are transferred to the finer grid through an interpolation process and used as boundary conditions for the latter. The finer grid data are then transferred back to the coarser one, thus improving the coarse grid values. The method is applied to several diffusion problems and significant improvements in accuracy and efficiency are shown.
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  • 33
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    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 115-115 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
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  • 34
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    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 131-142 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Numerical quadratures encountered in solving integral equations and in finite element analysis often involve singular integrands, or integrands with very rapid local variation whose numerical stability resembles that of singularities. It is shown that specialized quadrature formulae of Gauss-Christoffel type can be generated for such integrands, using a recursive procedure based on the properties of the underlying orthogonal polynomials. Quadrature formulae of moderately high degree can be computed rapidly enough to allow them to be constructed as needed. An algorithm for generating quadrature formulae is given in detail. Singular or near -singular functions encountered in finite element analysis typically require three -point or four -point quadratures; such formulae are readily obtained, to seven -figure accuracy, in computing times short enough to regard the formulae as disposable and not worth preserving in tables.
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    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 187-188 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
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    Topics: Electrical Engineering, Measurement and Control Technology
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    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 189-190 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
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    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 191-201 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: This paper presents an overview of the 3D transmission-line matrix method of analysis, describing the various nodes which are available to date: expanded node, asymmetrical condensed node, symmetrical condensed node. The most general scattering matrices of these nodes are given. The various techniques used to implement irregularly graded meshes are also described. A comparison of all the processes applied to the same structure is made. Conclusions on their use are then discussed.
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    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 279-279 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
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  • 39
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    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 249-265 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: The application of the transmission-line modelling technique to the design of semiconductor lasers and optical systems is reviewed. Generalized scattering matrices are developed to allow the technique to be applied to novel devices and systems.
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  • 40
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    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988), S. 3-6 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: The use of models in giving meaning to sense data is described. It is shown that models are essential to human understanding, but that there are no uniquely ‘best’ models. This leads to the discussion of the design of suitable models for engineering use. The role of physical and mathematical models is mentioned, and attention is drawn to geometrical and physical features. It is stated that numerical methods have overriding advantages, one of which is the possibility of numerical experimentation. The modelling of vector fields is discussed and attention is drawn to the ideas of differential geometry which attach the vector field to the space in which it acts. It is shown that variational methods, together with numerical experiments, can be used to derive invariant parameters which give both global and local information about electromagnetic systems in a particularly economical method of computation.
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  • 41
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988), S. 31-43 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: The coupling between incident electromagnetic fields and lossless multiconductor transmission systems is studied using transmission-line modelling-(TLM) and the impedance parameters of the transmission system. This calculation is a two-stage procedure:firstly, the field problem is solved, with no conductors present, to give the incident fields; secondly, the multiconductor transmission-line problem is solved using equivalent voltage and current sources representing coupling from the incident fields. Comparison of these results with previously published work shows excellent agreement. The numerical model presented is particularly suitable for studying electromagnetic compatibility problems.
    Additional Material: 16 Ill.
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  • 42
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    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988), S. 73-83 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: A discrete model is developed to describe the diffusion of dopant/impurity in a single semiconductor crystal during Czochralski growth. The basic diffusion mechanism is assumed to be substitutional-interstitial interchange for the impurity, together with self-diffusion of the host atoms. In particular, the model incorporates the complicated conditions that result from the simultaneous growth and diffusion taking place at the crystal/melt interface. The high temperature dependence of the process is also taken into account, together with possible vacancy production to counteract vacancy depletion. The numerical model is explicit in time, and conditions for convergence and stability are considered. Results are presented for chromium doping of growing gallium arsenide crystals, and compared with published experimental data.
    Additional Material: 5 Ill.
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  • 43
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988), S. 93-102 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: One- and two-dimensional algorithms for the transient simulation of semiconductor devices are presented which incorporate a solenoidal total current. The paper includes results from one-dimensional simulation of a p-n junction, including forward-to-reverse bias switching and also switching and also switch-on into high injection in an asymmetric structure. A discretization scheme for the two-dimensional formulation is described with details on handling voltage driven terminals and the associated boundary conditions.
    Additional Material: 6 Ill.
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  • 44
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988), S. 103-113 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: This paper describes the application of ASTEC3, a general purpose analogue electronic circuit simulation package, to the analysis of thermal properties of given structures. The modelling of each system is considered for both conduction and convection mechanisms, radiation being assumed to play a very minor role in heat dissipation from most electrical circuits. A procedure is given for the modelling of one-, two- and three-dimensional thermal problems which is then used for the simulation of relatively simple examples. The results obtained with ASTEC3 are compared with results determined by using more traditional and independent techniques.
    Additional Material: 9 Ill.
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  • 45
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988) 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Type of Medium: Electronic Resource
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  • 46
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988), S. 221-238 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: The development of numerical models to describe physical problems with irregular boundaries frequently involves the use of very fine or variable Cartesian meshes when a more descriptive mesh might be appropriate. This paper describes the application of the transmission line matrix (TLM) technique to the analysis of orthogonal curvilinear mesh problems. Although very high levels of accuracy are possible, the computational efficiency may be reduced owing to the stub admittance factor, S, and the need for an accurate evaluation of the transmission line parameters.
    Additional Material: 8 Ill.
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  • 47
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 61-73 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: A new P-N junction device model is presented. It consists of two numerical unidimensional macroscopic models. The first is a drift-diffusion model. The second is an energy model accounting for the carrier energy relaxation effects. Because device optimization requires systematic investigations, the computing time is of paramount importance and, so an accurate comparison between these two models was undertaken under both static steady-state and dynamic 94 GHz conditions in order to point out the relative interest of the energy model. This study is mainly devoted to silicon millimetre-wave IMPATTs. This comparison has highlighted the superiority of the energy model for the description of low field transport phenomena. But as IMPATT RF properties are mainly governed by high field transport, the RF power levels predicted by the two models have been found to be similar. Moreover it has shown that the energy model tends to underestimate both the efficiency and the diode terminal negative resistance level. This parasitic effect is inherent to the description of the carrier generation process by impact ionization which in this model is assumed to be governed by the carrier energy.
    Additional Material: 4 Ill.
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  • 48
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 113-113 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Type of Medium: Electronic Resource
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  • 49
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988) 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Type of Medium: Electronic Resource
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  • 50
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 117-129 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: The response of capacitive array sensors in the presence of flawed solid materials is simulated using finite elements and infinite elements with exponential decay. Conventional finite elements are used to model the critical regions near the probe and the surface of the solid. Infinite elements are used to represent the farfield conditions of the space surrounding the probe and the solid. The method is first applied to problems with analytic solutions to determine the accuracy of the results obtained using the infinite elements. The response of a capacitive array sensor is then simulated using a line integral which measures the relative change in admittance between flawed and unflawed solids. Examples of capacitive probe responses are given for several parametric variations of the flaw size and dielectric constant of the solid.
    Additional Material: 13 Ill.
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