Electronic Resource
Copenhagen
:
International Union of Crystallography (IUCr)
Applied crystallography online
10 (1977), S. 141-146
ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
An analysis of thickness variances from an electron-microscope cross-section of myelin sheath shows that the standard deviation varies proportionally to the square root of the number of intervening lamellae. This result implies that the lamellar irregularities are additive and that a paracrystalline stacking model is an appropriate representation for the myelin structure. The X-ray diffraction data from myelin exhibit the characteristics of a paracrystalline material. Both electron microscope and X-ray diffraction evidence suggest that myelin is paracrystalline rather than crystalline.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0021889877013132
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