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  • International Union of Crystallography (IUCr)  (940)
  • American Institute of Physics (AIP)
  • 1970-1974  (940)
  • 1973  (940)
Collection
Publisher
Years
  • 1970-1974  (940)
Year
  • 1
    Electronic Resource
    Electronic Resource
    Unit-cell dimension measurements from pairs of X-ray diffraction lines (1973)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 6 (1973), S. 122-128 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A method is described for precise unit-cell dimension measurements based on the accurate recording of the angular separation between two neighbouring orders of reflection which may correspond to different wavelengths. A number of pairs of reflections at high diffraction angles are used and a least-squares refinement is performed after taking into account the angular dependence of systematic aberrations. The method has been tested on Ge and several selenides (InSe, In2Se3, GaSe) and the accuracy of the results is discussed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889873008277
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  • 2
    Electronic Resource
    Electronic Resource
    The precision of interplanar distances measured by an energy-dispersive diffractometer (1973)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 6 (1973), S. 117-122 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: According to the papers so far published about diffractometers with energy-dispersive detectors, the precision of a measured lattice spacing has been estimated to be about 0.05% at best. In the present paper, it is shown that a precision of about 0.01% is attainable without much difficulty by the use of a suitable Soller-slit system and a suitable scattering angle. This was demonstrated on an Al powder sample. It has been concluded that the limitation of precision is in the electronics rather than in the detector, when the necessary conditions are realised in the present improved system.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889873008265
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  • 3
    Electronic Resource
    Electronic Resource
    An incident-beam ionization chamber and charge integration system for stabilization of X-ray diffraction experiments (1973)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 6 (1973), S. 129-132 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A low-absorption ionization chamber has been developed to monitor the incident beam in X-ray diffraction experiments. The chamber current is digitized by means of an ultra-stable linear charge integrator. The digital signal is used to control the measuring time for each point of the desired scattering curve. In our application, fluctuations in the scattering curve resulting from instability of the incident beam have been reduced by a factor of 5.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889873008289
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  • 4
    Electronic Resource
    Electronic Resource
    The measurement of single-crystal lattice parameters using a double-diffraction technique (1973)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 6 (1973), S. 132-135 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A modified double-diffraction technique is described for the accurate measurement of lattice parameters of (100) slices of gallium arsenide. The method relies on the selection of appropriate reflexions for producing a pseudo-point of triple diffraction, and the determination of the wavelength necessary to produce such a triple point. Results are presented which show that lattice parameters can be determined rapidly and simply to better than 1 in 105.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889873008290
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  • 5
    Electronic Resource
    Electronic Resource
    Double diffraction des rayons X par une substance amorphe (1973)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 6 (1973), S. 139-144 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The effect of the double-scattering process on X-ray intensity diffracted by an amorphous sample is studied in the case of &thgr;–2&thgr; diffractometric techniques with monochromator, by transmission and reflexion; the small-angle X-ray scattering method is taken into account. An experimental application shows the amount of the correction in the case of transmission.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889873008319
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  • 6
    Electronic Resource
    Electronic Resource
    Precision lattice parameters and the coefficients of thermal expansion of hexagonal germanium dioxide (1973)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 6 (1973), S. 136-138 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: With a Unicam 19 cm high-temperature powder camera, precision lattice parameters of hexagonal germanium dioxide have been determined at various temperatures in the range 36 to 516 °C by the X-ray method. From these data the coefficients of thermal expansion have been evaluated by a graphical method. The temperature dependence of the coefficients of thermal expansion, α|| and α⊥, parallel and perpendicular to the principal axis respectively, are represented by the following equations: \alpha _{\mid \mid} = 1.258 \times 10^{-6} + 1.359 \times 10^{-8}T - 1.032 \times 10^{-11} T^{2}{^\circ} {\rm C}^{-1}\alpha _{\perp} = 10.558 \times 10^{-6} + 8.813 \times 10^{-9}T + 5.785 \times 10^{-12} T^{2}{^\circ} {\rm C}^{-1} where T is the numerical value of the temperature expressed in °C. The thermal expansion of hexagonal GeO2 has been compared with that of the isomorphous α-quartz and the polymorphous tetragonal rutile-type GeO2.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889873008307
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  • 7
    Electronic Resource
    Electronic Resource
    Influence of crystal size on electron diffraction intensities (1973)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 6 (1973), S. 145-148 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The Debye–Waller factor for small ( ̃35 Å) and large ( ̃290 Å) Au crystallites was measured by electron diffraction at two temperatures. After correction for the large dynamical effects observed for the big crystallites, the Debye–Waller factors for the two specimens remained different. The difference is attributed to surface influences on the lattice vibrations.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889873008320
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  • 8
    Electronic Resource
    Electronic Resource
    Computerization of Ruland's X-ray method for determination of the crystallinity in polymers (1973)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 6 (1973), S. 148-152 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A general procedure for determination of the crystallinity in polymers from the X-ray diffraction pattern was developed by modifying the method described by Ruland [Acta Cryst. (1961), 14, 1180–1185] on two points. One of these modifications furthermore permits substantial reduction of the required number of experimental data without a serious loss of accuracy being involved.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889873008332
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  • 9
    Electronic Resource
    Electronic Resource
    Consideration of the optimum precession angle for upper-level precession photographs. A correction (1973)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 6 (1973), S. 158-158 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A correction to Fig. 1 in Cross, Fenn & Graham [J. Appl. Cryst. (1972), 5, 304–305] is given.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889873008356
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  • 10
    Electronic Resource
    Electronic Resource
    X-ray powder diffractometry of small (20 mg to 1 μg) samples using standard equipment (1973)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 6 (1973), S. 153-157 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Calculations of the diffraction intensities from a small specimen on a counter diffractometer show that, with a 10–20 mg specimen, the intensities should be 50% or more of those obtained from a normal specimen. Observed values are in reasonable agreement with the calculations. With small quantities the strategy is to disperse the sample evenly as a fine powder over the whole irradiated area. This is especially important at the lower diffraction angles. A glass support is usually suitable. With specimens 〈 1 mg in weight dispersion difficulties can be eased by mixing with diamond powder, and background scattering can be considerably reduced by using a single crystal as a support. The lower limit of detection of quartz by this method has been shown to be probably 〈 1 μg. Quantitative estimates of 10% quartz in a few milligrams of sample and crystallite size measurements on 50 μg of nickel oxide are examples of work with these experimental arrangements.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889873008344
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