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Characterization of diamond single crystals by means of double-crystal X-ray diffraction and positron annihilation

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Abstract

The crystallinity of synthesized and natural crystals of diamond was characterized by double-crystal X-ray diffraction and positron annihilation. The two-dimensional angular correlation of annihilation radiation and positron lifetime measurements revealed that in natural crystals positroniums are formed in a high fraction. The synthesized crystal Ib showed both an extremely small width for the diffraction and a positron lifetime spectrum with a single component of the lifetime of 115 ps. In contrast, the natural diamonds contain a long-lived component of lifetime longer than 2 ns. The diffusion length of positrons was also measured by a variable-energy positron beam. In the synthesized crystal IIa, a diffusion length of about 100.8 nm was observed.

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Authors and Affiliations

  1. Itami Research Laboratories, Sumitomo Electric Industries Ltd., 1-1-1 Koya-kita, 664, Itami, Japan

    S. Fujii, Y. Nishibayashi & S. Shikata

  2. Institute of Materials Science, University of Tsukuba, 305, Tsukuba, Ibaraki, Japan

    A. Uedono & S. Tanigawa

Authors
  1. S. Fujii
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  2. Y. Nishibayashi
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  3. S. Shikata
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  4. A. Uedono
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  5. S. Tanigawa
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Fujii, S., Nishibayashi, Y., Shikata, S. et al. Characterization of diamond single crystals by means of double-crystal X-ray diffraction and positron annihilation. Appl. Phys. A 61, 331–333 (1995). https://doi.org/10.1007/BF01538199

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  • DOI: https://doi.org/10.1007/BF01538199

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