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Title:	Serial block-face scanning electron microscopy combined with double-axis electron beam tomography provides new insight into cellular relationships
Source:	Journal of electron microscopy [0022-0744] Sawai, T yr:2013

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description	9.	Helmstaedter, M. "3D structural imaging of the brain with photons and electrons." Current Opinion in Neurobiology 18.6 (2008): 633-41.
description	10.	Joy, D. "SCANNING ELECTRON MICROSCOPY Second best no more." Nature Materials 8.10 (2009): 776-777.
description	11.	Humbel, C T W M M. "Tomography of insulating biological and geological materials using focused ion beam (FIB) sectioning and low-kV BSE imaging." Journal of microscopy 233.3 (2009): 372-83.
description	12.	Mcgeoch, J. "Topology of the mammalian cell via cryo-FIB etching." Journal of microscopy 227.2 (2007): 172-184.
description	13.	Hayles, M. "A technique for improved focused ion beam milling of cryo-prepared life science specimens." Journal of microscopy 226.3 (2007): 263-269.
description	14.	Moerner, W. E. "New directions in single-molecule imaging and analysis." Proceedings of the National Academy of Sciences of the United States of America 104.31 (2007): 12596-12602.
description	15.	Torres, E A A. "In situ scanning electron microscopy." Science and technology of welding and joining 16.1 (2011): 68-78.
description	16.	Fu, Y. "Self-organized formation of a blazed-grating-like structure on Si(100) induced by focused ion-beam scanning." Optics express 12.2 (2004): 227-233.
description	17.	Vernon-Parry, K. "Scanning electron microscopy: an introduction." III-Vs review 13.4 (2000): 40-44.
description	18.	Mulders, J. "Redeposition characteristics of focused ion beam milling for nanofabrication." Journal of vacuum science & technology 2007. 2215-2218.
description	19.	Lalev, G. "Data preparation for focused ion beam machining of complex three-dimensional structures." Proceedings of the Institution of Mechanical Engineers Part B Journal of Engineering Manufacture 222.1 (2008): 67-76.
description	20.	Pan, C. "Silicon-based coupling platform for optical fiber switching in free space." Journal of Micromechanics and Microengineering 14.1 (2004): 129-137.