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Mapping alpha-Particle X-Ray Fluorescence Spectrometer (Map-X)Many planetary surface processes (like physical and chemical weathering, water activity, diagenesis, low-temperature or impact metamorphism, and biogenic activity) leave traces of their actions as features in the size range 10s to 100s of micron. The Mapping alpha-particle X-ray Spectrometer ("Map-X") is intended to provide chemical imaging at 2 orders of magnitude higher spatial resolution than previously flown instruments, yielding elemental chemistry at or below the scale length where many relict physical, chemical, and biological features can be imaged and interpreted in ancient rocks.
Document ID
20140017618
Acquisition Source
Ames Research Center
Document Type
Conference Paper
Authors
Blake, D. F. (NASA Ames Research Center Moffett Field, CA United States)
Sarrazin, P. (Search for Extraterrestrial Intelligence Inst. Mountain View, CA, United States)
Bristow, T. (NASA Ames Research Center Moffett Field, CA United States)
Date Acquired
December 22, 2014
Publication Date
November 4, 2014
Subject Category
Space Sciences (General)
Report/Patent Number
ARC-E-DAA-TN18153
Meeting Information
Meeting: International Workshop on Instrumentation for Planetary Missions (IPM-2014)
Location: Greenbelt, MD
Country: United States
Start Date: November 4, 2014
End Date: November 7, 2014
Sponsors: NASA Headquarters, Universities Space Research Association
Funding Number(s)
WBS: WBS 857464
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
CCD Camera
planetary
Map-X

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