Orientation Imaging Microscopy Applied to Zirconia Ceramics

Abstract.

 Measurements of crystallographic orientations along with microscopic observations are the basis of quantitative investigations of the microstructure of crystalline materials. The technique that applies automatic orientation measurements in the transmission or scanning electron microscope is known as orientation imaging microscopy (OIM) [1]. In this paper the measurements and analyses of sets of single orientations gained from electron backscattered diffraction (EBSD) registered in a scanning electron microscope are presented. A quantitative description of microstructure of two polymorphs of zirconia, based on measurements of single orientations, is also given.