Photoluminescence and X-ray Absorption Fine Structure Analysis of Sm-Doped TiO2 Thin Films

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Published 20 June 2012 • Copyright (c) 2012 The Japan Society of Applied Physics
, , Citation Junpei Sakurai et al 2012 Jpn. J. Appl. Phys. 51 06FG03 DOI 10.1143/JJAP.51.06FG03

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Author affiliations

1 Advanced Device Laboratories and Department of Physics, Tokyo University of Science, Shinjuku, Tokyo 162-8601, Japan

2 Faculty of Engineering, Toyo University, Kawagoe, Saitama 350-8585, Japan

3 Japan Atomic Energy Agency (JAEA), Naka, Ibaraki 319-1195, Japan

Dates

  1. Received 29 November 2011
  2. Accepted 26 January 2012
  3. Published

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Abstract

The local structure of samarium-doped titanium dioxide (TiO2:Sm) thin films fabricated by laser ablation and post annealing has been investigated by Sm L III-edge X-ray absorption fine structure (XAFS) analysis using a synchrotron radiation. The TiO2:Sm samples at annealing temperatures lower than 1000 °C showed an anatase (A-)TiO2:Sm crystal structure and transferred into a rutile (R-)TiO2:Sm phase at annealing temperature of 1100 °C. All the A-TiO2:Sm phase samples showed intense Sm-related photoluminescence (PL) at room temperature. It was shown that the samples which showed intense PL have shorter coordination distance for the first nearest neighbor of Sm than that of the samples which did not show PL after the crystal phase transition.

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10.1143/JJAP.51.06FG03