SFX by Ex Libris Inc.

Title:	Calibration of lateral force measurements in atomic force microscopy with a piezoresistive force sensor
Source:	Review of Scientific Instruments [0034-6748] Xie, Hui yr:2008

Basic

Full text

Full text available via AIP Journals (American Institute of Physics)

Year:

Volume:

Issue:

Start Page:

Document delivery

Request document via Library/Bibliothek

Users interested in this article also expressed an interest in the following:
description	1.	Chung, K. "Note: Lateral force microscope calibration using multiple location pivot loading of rectangular cantilevers." Review of scientific instruments 81.2 (2010): 26104-.
description	2.	Leroy. "Fine calibration of the residual dissipation in a surface forces apparatus using a capacitive sensor." Review of scientific instruments 80 (2009): 85103-.
description	3.	Fernandes, M. "Novel method for measuring nanofriction by atomic force microscope." Journal of vacuum science & technology 26.2 (2008): 643-650.
description	4.	Quintanilla, M. "A calibration method for lateral forces for. use with colloidal probe force microscopy cantilevers." Review of scientific instruments 79.2 (2008): 23701-.
description	5.	Palacio, M. "Normal and Lateral Force Calibration Techniques for AFM Cantilevers." Critical Reviews in Solid State and Materials Sciences 35.2 (2010): 73-104.
description	6.	Kiracofe, D. "On eigenmodes, stiffness, and sensitivity of atomic force microscope cantilevers in air versus liquids." Journal of applied physics 107.3 (2010): 33506-33515.
description	7.	Wang, Y. "Improved parallel scan method for nanofriction force measurement with atomic force microscopy." Review of scientific instruments 78.3 (2007): 36107-.
description	8.	Andersson, M. "Using optical tweezers for measuring the interaction forces between human bone cells and implant surfaces: System design and force calibration." Review of scientific instruments 78.7 (2007): 74302-.
description	9.	Levy, R. "Measuring the spring constant of atomic force microscope cantilevers: Thermal fluctuations and other methods." Nanotechnology 13.1 (2002): 33-37.
description	10.	Munz, M. "Force calibration in lateral force microscopy: a review of the experimental methods." Journal of physics. D, Applied physics 43.6 (2010): 63001-.
description	11.	Attard, P. "Measurement of friction coefficients with the atomic force microscope." Journal of physics. Conference series 2007. 51-55.
description	12.	Wagner, K. "Noncontact Method for Calibration of Lateral Forces in Scanning Force Microscopy." Langmuir 27.8 (2011): 4635-4644.
description	13.	Abramovitch, D.Y. Y. "A tutorial on the mechanisms, dynamics, and control of atomic force microscopes." Proceedings of the American Control Conference (2007): 3488-3502.
description	14.	Butt, H. "Calculation of thermal noise in atomic force microscopy." Nanotechnology 6.1 (1995): 1-7.
description	15.	Sader, John E. "Calibration of rectangular atomic force microscope cantilevers." Review of scientific instruments 70.10 (1999): 3967-3969.
description	16.	Valle-Delgado, J. J. "Adhesion Forces between Protein Layers Studied by Means of Atomic Force Microscopy." Langmuir 22.11 (2006): 5108-5114.
description	17.	Gruetter, P. "Atomic Force Microscopy in Viscous Ionic Liquids." Langmuir 28.12 (2012): 5319-5322.
description	18.	Manzaneque, T. "Analysis of the quality factor of piezoelectric-actuated micro-resonators." Proceedings of SPIE--the international society for optical engineering 7362.PAGE (2009): 73620-73620.
description	19.	Liu, Y. "Optimization and calibration of atomic force microscopy sensitivity in terms of tip-sample interactions in high-order dynamic atomic force microscopy." Journal of applied physics 106.12 (2009): 124507-.
description	20.	Kim, M. "Accurate determination of spring constant of atomic force microscope cantilevers and comparison with other methods." Measurement 43.4 (2010): 520-526.