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Title:
Influence of impurity concentration in Ge sources on electrical properties of Ge/Si hetero-junction tunneling field-effect transistors
Source:
Applied Physics Letters [0003-6951] Bae, Tae-Eon yr:2018
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Bae, Tae-Eon
Kato, Kimihiko
Suzuki, Ryota
Nakane, Ryosho
Takenaka, Mitsuru
Takagi, Shinichi
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author:
Bae, Tae-Eon
Kato, Kimihiko
Suzuki, Ryota
Nakane, Ryosho
Takenaka, Mitsuru
Takagi, Shinichi
last name
initials
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author:
Bae, Tae-Eon
Kato, Kimihiko
Suzuki, Ryota
Nakane, Ryosho
Takenaka, Mitsuru
Takagi, Shinichi
last name
initials
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