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Title:
Evaluating AlGaN/AlN/GaN heterostructure Schottky barrier heights with flat-band voltage from forward current-voltage characteristics
Source:
Applied Physics Letters [0003-6951] Lv, Yuanjie yr:2011
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Lv, Yuanjie
Lin, Zhaojun
Meng, Lingguo
Yu, Yingxia
Luan, Chongbiao
Cao, Zhifang
Chen, Hong
Sun, Baoquan
Wang, Zhanguo
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author:
Lv, Yuanjie
Lin, Zhaojun
Meng, Lingguo
Yu, Yingxia
Luan, Chongbiao
Cao, Zhifang
Chen, Hong
Sun, Baoquan
Wang, Zhanguo
last name
initials
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author:
Lv, Yuanjie
Lin, Zhaojun
Meng, Lingguo
Yu, Yingxia
Luan, Chongbiao
Cao, Zhifang
Chen, Hong
Sun, Baoquan
Wang, Zhanguo
last name
initials
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