SFX by Ex Libris Inc.

Title:	Characterization of biaxially-stretched plastic films by generalized ellipsometry
Source:	Thin Solid Films [0040-6090] Elman, J F yr:1998

Basic

Full text

Full text available via EZB-NALI5-00465 Elsevier Archive NL

Year:

Volume:

Issue:

Start Page:

Document delivery

Request document via Library/Bibliothek

Users interested in this article also expressed an interest in the following:
description	1.	Jarrendahl, K. "Multiple sample analysis of spectroscopic ellipsometry data of semi-transparent films." Thin Solid Films 1998. 114-118.
description	2.	Jerrams, R. "Determination of non-linear, large, equal biaxial stresses and strains in thin elastomeric sheets by bubble inflation." Proceedings of the Institution of Mechanical Engineers. Proceedings part L, Journal of materials: design and applications 216.L4 (2002): 233-243.
description	3.	Schubert, M. "Extension of rotating-analyzer ellipsometry to generalized ellipsometry: determination of the dielectric function tensor from uniaxial TiO_2." Journal of the Optical Society of America. B, Optical physics 13.4 (1996): 875-.
description	4.	Schubert, M. "Generalized transmission ellipsometry for twisted biaxial dielectric media: application to chiral liquid crystals." Journal of the Optical Society of America. B, Optical physics 13.9 (1996): 1930-.
description	5.	Losurdo, M. "Interrelation between nanostructure and optical properties of oxide thin films by spectroscopic ellipsometry." Surface & coatings technology 151 (2002): 2-8.
description	6.	Ogieglo, W. "Spectroscopic Ellipsometry Analysis of a Thin Film Composite Membrane Consisting of Polysulfone on a Porous alpha-Alumina Support." ACS applied materials & interfaces 4.2 (2012): 935-943.
description	7.	Anderson, Iain A. "Multi-functional dielectric elastomer artificial muscles for soft and smart machines.(Report)." Journal of applied physics 112.4 (2012): 41101-1.
description	8.	Perez-Nieto, A. "Image analysis of structural changes in dough during baking." Lebensmittel-Wissenschaft + [i.e. und] Technologie 43.3 (2010): 535-543.
description	9.	Schubert, M. "Generalized ellipsometry and complex optical systems." Thin Solid Films 313 (1998): 323-332.
description	10.	Ambrosch-Draxl, C. "Optical Constants and Inelastic Electron-Scattering Data for 17 Elemental Metals." Journal of physical and chemical reference data 38.4 (2009): 1013-1092.
description	11.	Hiltner, A. "The effect of strain state on the biostability of a poly(etherurethane urea) elastomer." Journal of biomedical materials research 35.3 (1997): 319-328.
description	12.	Postava, K. "Spectroellipsometric characterization of materials for multilayer coatings." Applied surface science 175 (2001): 276-280.
description	13.	Ambrosch Draxl, C. "Relativistic effects on the linear optical properties of Au, Pt, Pb and W." New journal of physics 12.10 (2010): 103048-.
description	14.	Summonte, C. "Optimization of ITO layers for applications in a-Si/c-Si heterojunction solar cells." Thin Solid Films 425.1-2 (2003): 185-192.
description	15.	Tlapale-Valdivia,, Alma D., A. "Dough and crumb grain changes during mixing and fermentation and their relation with extension properties and bread quality of yeasted sweet dough." International journal of food science & technology 45.3 (2010): 530-539.
description	16.	Gilliland, S. "Electronic structure of p-type ultraviolet-transparent conducting CUScO2 films." Thin Solid Films 516.7 (2008): 1431-1433.
description	17.	Losurdo, M. "Dielectric function of V2O5 nanocrystalline films by spectroscopic ellipsometry: Characterization of microstructure." Applied physics letters 77.8 (2000): 1129-1131.
description	18.	Losurdo, M. "Spectroscopic ellipsometry study on e-beam deposited titanium dioxide films." Thin Solid Films 455.1 (2004): 525-9.
description	19.	Sanz, J M. "An ELS study of the oxidation of polycrystalline Ta and Nb at room temperature." Journal of electron spectroscopy and related phenomena 34.2 (1984): 149-.
description	20.	Kaltenbrunner, M. "Stretchable Batteries: Arrays of Ultracompliant Electrochemical Dry Gel Cells for Stretchable Electronics (Adv. Mater. 18/2010." Advanced materials 22.18 (2010).