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Swept frequency technique for dispersion measurement of microstrip linesMicrostrip lines used in microwave integrated circuits are dispersive. Because a microstrip line is an open structure, the dispersion can not be derived with pure TEM, TE, or TM mode analysis. Dispersion analysis has commonly been done using a spectral domain approach, and dispersion measurement has been made with high Q microstrip ring resonators. Since the dispersion of a microstrip line is fully characterized by the frequency dependent phase velocity of the line, dispersion measurement of microstrip lines requires the measurement of the line wavelength as a function of frequency. In this paper, a swept frequency technique for dispersion measurement is described. The measurement was made using an automatic network analyzer with the microstrip line terminated in a short circuit. Experimental data for two microstrip lines on 10 and 30 mil Cuflon substrates were recorded over a frequency range of 2 to 20 GHz. Agreement with theoretical results computed by the spectral domain approach is good. Possible sources of error for the discrepancy are discussed.
Document ID
19870005164
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Lee, R. Q. (NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
September 5, 2013
Publication Date
January 1, 1986
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
NAS 1.15:88836
NASA-TM-88836
E-3215
Accession Number
87N14597
Funding Number(s)
PROJECT: RTOP 506-58-22
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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