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Angewandte Oberflächenanalyse : mit SIMS Sekundär-Ionen-Massenspektrometrie, AES Auger-Elektronen-Spektrometrie, XPS Röntgen-Photoelektronen-Spektrometrie [3-540-15050-1] Grasserbauer, Manfred

yr:1986 pg:VIII -300S.:Ill.,graph.Darst.

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