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Title:
The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision
Source:
Ultramicroscopy [0304-3991] Padgett, Elliot yr:2020
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Padgett, Elliot
Holtz, Megan E
Cueva, Paul
Shao, Yu-Tsun
Langenberg, Eric
Schlom, Darrell G
Muller, David A
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author:
Padgett, Elliot
Holtz, Megan E
Cueva, Paul
Shao, Yu-Tsun
Langenberg, Eric
Schlom, Darrell G
Muller, David A
last name
initials
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author:
Padgett, Elliot
Holtz, Megan E
Cueva, Paul
Shao, Yu-Tsun
Langenberg, Eric
Schlom, Darrell G
Muller, David A
last name
initials
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