Development of scanning X-ray microscopes for materials science spectromicroscopy at the Advanced Light Source

Ade, H.; Cerasari, S.; Denlinger, J.; Franck, K.; Garcia, A.; Hayakawa, S.; Hitchcock, A.; Kikuma, J.; Klingler, S.; Kortright, J.; Morisson, G.; Moronne, M.; Rightor, E.; Rotenberg, E.; Seal, S.; Shin, H.-J.; Steele, W.F.; Tonner, B.P.; Warwick, T.

doi:10.1107/S0909049597014283

Development of scanning X-ray microscopes for materials science spectromicroscopy at the Advanced Light Source

T. Warwick, H. Ade, S. Cerasari, J. Denlinger, K. Franck, A. Garcia, S. Hayakawa, A. Hitchcock, J. Kikuma, S. Klingler, J. Kortright, G. Morisson, M. Moronne, E. Rightor, E. Rotenberg,, S. Seal, H.-J. Shin, W. F. Steele and B. P. Tonner

The development of two zone-plate microscopes for X-ray spectroscopic analysis of materials is described. This pair of instruments will provide imaging NEXAFS analysis of samples in transmission at atmospheric pressure and imaging XPS and NEXAFS analysis of sample surfaces in a UHV environment.

Keywords: spectromicroscopy; NEXAFS; XPS; zone plates.

Read article Similar articles

Format		BIBTeX
		EndNote
		RefMan
		Refer
		Medline
		CIF
		SGML
		Text
		Plain Text

Format		BIBTeX
		EndNote
		RefMan
		Refer
		Medline
		CIF
		SGML
		Text
		Plain Text

Search IUCr Journals		doi		Advanced search
Author		volume	page