Abstract
A high-accuracy method for measuring helium-level changes was developed. Measurements made above 1 K were in agreement with the generally accepted behavior of the helium film. A very slight dependence of the transfer rateR on the level difference was observed atall level differences. Below ∼1 K the transfer shows an entirely new pattern;R increases and becomes strongly dependent on the level difference. The transfer also displays some metastability, two distinct rates being possible at the same temperature, level difference, and barrier height. Measurements of the inertial oscillations indicate that there is no increase in the film thickness at low temperatures.
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Martin, D.J., Mendelssohn, K. Transfer of the helium film between 0.3 K and the λ point. J Low Temp Phys 5, 211–225 (1971). https://doi.org/10.1007/BF00629574
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DOI: https://doi.org/10.1007/BF00629574