Abstract
We present a critical review on the use of STM as anin situ technique to characterize electrochemical systems based on the work performed in our laboratory. Contributions ofin situ STM studies include: (i) atomic resolution of electrodeposited lead on graphite; (ii) imaging of modifications on metallic electrode surfaces induced by electrochemical oxidation-reduction processes; (iii) imaging of corrosion process on aluminium and Al-Ta alloy electrodes in NaCl solution; (iv) characterization of semiconductor-solution interfaces. These studies allowed: (a) establishment of STM as a technique which, for some systems, yields atomic resolution of metallic surfaces in air and in solution; (b) establishment of a mechanism for the electrochemical growth of oxide films on metal electrodes; (c) establishment of a corresponding mechanism for the reduction of those electrochemically grown oxide films; (d) direct monitoring of corrosion processes on a scale of nm to μm; and (e) determination of the presence of surface states and their energy position at the semiconductor-solution interfaces.
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This paper is dedicated to Professor Brian E. Conway on the occasion of his 65th birthday and in recognition of his outstanding contribution to electrochemistry.
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González-Martín, A., Bhardwaj, R.C. & Bockris, J.O. Somein situ STM contributions to the characterization of electrochemical systems. J Appl Electrochem 23, 531–546 (1993). https://doi.org/10.1007/BF00721943
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DOI: https://doi.org/10.1007/BF00721943