Precision lattice parameter measurement by the X-ray divergent-beam technique

A method is described for precision measurement of lattice parameters in cubic crystals, interplanar spacings and angles between crystallographic directions for single crystals of any system. The minimum measurable values of angle between crystallographic directions, Δd/d and Δa/a have been found to be ~ 10⁵ rad, ~ 3 × 10⁻⁵, and ~ 5 × 10⁻⁵, respectively.