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  • High voltage electron microscopy  (1)
  • 1
    Electronic Resource
    Electronic Resource
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 3 (1986), S. 135-149 
    ISSN: 0741-0581
    Keywords: High voltage electron microscopy ; Energy loss spectroscopy ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: This paper describes work on the counting of electrons in high voltage electron microscopy (HVEM). A reliable counting method is needed in order to perform quantitative experiments. A scintillator-photomultiplier device has been adapted to these needs. It has been used here, in the field of electron energy loss spectroscopy. It permits the recording of the totality of the spectrum from the no-loss peak to the inner shell excitation characteristic signals because of a dynamic equal to at least 7. A simple mounting has been made to eliminate the artifacts caused by X-ray pulses. It is shown that HVEM is favourable to the counting of electrons, and some applications are reported.
    Additional Material: 17 Ill.
    Type of Medium: Electronic Resource
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