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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    The European physical journal 96 (1994), S. 87-92 
    ISSN: 1434-6036
    Keywords: 73.20.-r ; 79.60.Bm
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Angle resolved core level studies of the Si 2p and W 4f levels have been carried out on the (110) surface of a WSi2 single crystal using synchrotron radiation. Surface shifted components have been revealed both in the Si 2p and W 4f spectra. Investigations were carried out at two different annealing temperatures. The results indicate Si enrichment at the surface, and a larger enrichment after the higher temperature anneals. The reactivity upon initial oxygen exposure was investigated. Strong Si oxidation was observed but chemically shifted W 4f components could also be detected.
    Type of Medium: Electronic Resource
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