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  • American Institute of Physics (AIP)  (2)
  • 2000-2004  (2)
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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 6965-6967 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: SmCo films with a Cr underlayer have been investigated as potentially attractive candidates for high density recording media. Magnetron sputtering was used here to produce Cr/SmCox/Cr films on Si (100) substrates. The magnetic films were deposited at a substrate temperature of 350 °C and an Ar pressure of 5 mTorr. Cr underlayers were deposited both at 25 °C and at 350 °C and exhibited different textures. Layer thicknesses were evaluated using Rutherford backscattering spectroscopy, while SmCo grain size and underlayer texture were determined from a Rietveld analysis of x-ray diffraction data. The magnetic properties were measured with a vibrating sample magnetometer. The resulting films had in-plane coercivities in the range 4–8 kOe. For a SmCo layer with a thickness of 200 nm, the Cr underlayer thickness was varied in the range 75–300 nm to study its effect on intergranular coupling in the films. For thermally demagnetized samples, both magnetizing and demagnetizing remanence curves were measured and used to evaluate switching field distributions and δm plots. The underlayer texture was found to affect magnetic properties more strongly than underlayer thickness. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 1387-1394 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Magnetization reversal was studied in hybrid magnets consisting of ferrite and ribbons of the Magnequench alloy MQP-Q (Nd2Fe14B+α-Fe). Recent studies of demagnetization processes in permanent magnets have used two different methods for determining the reversible magnetization, often arriving at conflicting results. The reversible Mrev and irreversible Mirr magnetizations were determined here by the two different procedures: (i) In the dc demagnetization method, the demagnetization remanence is measured for reverse magnetic fields after saturation in the forward direction. Assuming the change in magnetization along the recoil curve is reversible, the remanent magnetization is identified with the irreversible magnetization Mirr. (ii) Alternatively, the intrinsic reversible susceptibility χrevi was measured by defining it as the mean slope of a small minor loop performed after determining the time dependence of M. The reversible susceptibility was then integrated to obtain Mrev. Although the two procedures for determining Mrev are frequently considered equivalent, we discuss here the differences that arise when one or the other method is used. These differences may be important when magnetic materials are characterized using switching field distributions, Henkel plots, or δM plots. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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