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  • 1
    Electronic Resource
    Electronic Resource
    Interaction force detection in scanning probe microscopy: Methods and applications (1992)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 72 (1992), S. 1778-1798 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Fundamental aspects of interaction force detection and force microscopy are discussed. A formalism is developed for studying the dynamics of experimental setups in general terms. The analysis focuses on stability criteria and resonant properties of the force sensor. The latter are important for measuring interaction force gradients. Experimental techniques used for interaction force detection are examined in detail. Finally, experimental results are presented that demonstrate the potential of combining atomic scale interaction force detection with scanning tunneling microscopy.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.352348
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  • 2
    Electronic Resource
    Electronic Resource
    Variable-temperature ultrahigh vacuum scanning tunneling microscope: Mechanical and electronic instrumentation (1992)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 63 (1992), S. 5634-5643 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A variable-temperature ultrahigh vacuum scanning tunneling microscope is described which was specifically designed for the study of Ga surfaces close to the bulk melting point (Tm=29.8 °C). Since the temperature must be controlled with great accuracy the sample stage and the rest of the microscope are in thermal equilibrium. The instrument also incorporates a novel approach to vibration isolation that is based on a lossy acoustic waveguide. Analog electronics form an integral part of the microscope since a dynamic range of 120 dB must be reached. Interconnection techniques are discussed in this context and a circuit of a high-voltage amplifier is shown that provides a voltage swing of ±400 V with less than 1 mVpp noise over a bandwidth of 10 kHz. Results are presented which confirm the design concepts applied to this instrument.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1143393
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  • 3
    Electronic Resource
    Electronic Resource
    Nanoguitar: Oscillating string as force sensor (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 3576-3579 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A force sensor is presented that makes use of an oscillating string. In a conventional scanning force microscopy setup comprising a tip and a sample consisting of a flexible cantilever beam, a string is attached to the free end of the beam along its deflection axis. Changes of the tip–sample interaction force modify the string tension and hence the resonance frequency of transverse oscillations. These oscillations can have amplitudes of the order of microns without causing noticeable wavering of the cantilever beam. This kind of sensor is particularly suitable for applications that require a stiff sensor. A prototype was built using a carbon fiber 5 μm in diameter and 4 mm in length, oscillating at 4 kHz. A force resolution of 2.5 nN was achieved in vacuum for a response time of 1 ms and a sensor stiffness of 160 N/m. For a conventional beam deflection sensor of equal stiffness this corresponds to a deflection sensitivity of 0.015 nm. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145472
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  • 4
    Electronic Resource
    Electronic Resource
    Ultrahigh vacuum compatible cooling and vibration isolation stage (1993)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 64 (1993), S. 3644-3646 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A scheme is described that resolves the problem of coupling sensitive equipment to a heat exchanger while retaining excellent isolation against vibrations in an ultrahigh vacuum environment.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1144244
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  • 5
    Electronic Resource
    Electronic Resource
    Logarithmic current-to-voltage converter for local probe microscopy (1997)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 68 (1997), S. 3814-3816 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A quasilogarithmic current–voltage converter has been built which allows currents spanning an exceptionally broad range from 10 pA to 10 mA with a bandwidth greater than 2 kHz to be measured. The converter is based on the virtual ground scheme employing semiconductor diodes as nonlinear elements in the feedback path. It is ideally suited for studying local interactions in scanning tunneling microscopy. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1148005
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  • 6
    Electronic Resource
    Electronic Resource
    Local modification of magnetic properties by an electron beam (1998)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 73 (1998), S. 3598-3600 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Magnetic anisotropies can be modified locally by intense electron beams with keV energy. In ultrathin epitaxial Co films grown on Pt(111), switching of the easy axis from parallel to perpendicular to the surface can be induced, and the domain size can be enlarged by one order of magnitude. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.122836
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  • 7
    Electronic Resource
    Electronic Resource
    Near-field optical scanning microscopy in reflection (1988)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 52 (1988), S. 249-251 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The resolution of near-field optical scanning microscopy (NFOS) is determined by the dimensions of the microscopic light source rather than the diffraction limit. To demonstrate NFOS in reflection, intensity changes in the (backward) scattering from a 70–100 nm diam hole in a metal film were recorded while the sample was scanned in close proximity to this aperture. Raster-scan images of a planar metal test pattern yield a resolution comparable to the size of the aperture.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.99483
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  • 8
    Electronic Resource
    Electronic Resource
    Dynamic force microscopy by means of the phase-controlled oscillator method (1997)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 82 (1997), S. 3641-3651 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Dynamic force microscopy, a technique also known as non-contact force microscopy, has proved to be a powerful tool for atomic resolution imaging. A number of schemes have been developed, but recently the oscillator method has become the preferred operating mode. Here, the force sensor acts as resonator in an active feedback circuit. A practical implementation of the method is described and the underlying key concepts are discussed. It is shown that a tracking oscillator excitation scheme is superior to the more standard direct feedback method for cases in which the force sensor exhibits only a weak resonance enhancement. Furthermore, the simultaneous measurement of dissipative interaction channels is an important extension of dynamic force microscopy. It allows one to differentiate between sample materials via their plasto-mechanical response. As an example, a Cr test grating has been imaged in the constant force gradient mode. The dissipation measured on Cr-covered areas is significantly lower than that on the bare quartz glass substrate, which enables one to distinguish between the two materials with a lateral resolution comparable to that of the topographic image. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.365726
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  • 9
    Electronic Resource
    Electronic Resource
    Near-field optical-scanning microscopy (1986)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 59 (1986), S. 3318-3327 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Near-field optical-scanning (NFOS) microscopy or "optical stethoscopy'' provides images with resolution in the 20-nm range, i.e., a very small fraction of an optical wavelength. Scan images of metal films with fine structures presented in this paper convincingly demonstrate this resolution capability. Design of an NFOS microscope with tunnel distance regulation, its theoretical background, application potential, and limitations are discussed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.336848
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  • 10
    Electronic Resource
    Electronic Resource
    Study of yielding mechanics in nanometer-sized Au contacts (1996)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 68 (1996), S. 637-639 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Yielding properties of Au point contacts of nanometer-scale dimensions have been studied using a scanning tunneling microscope supplemented by a force sensor for measuring tip–sample forces. The contacts are made by indenting the tip typically 10 nm into the substrate, whereby an adhesion neck is formed. Three consecutive deformation phases of the neck can be identified during retraction of the tip: (1) buildup of tensile stress, (2) incomplete fracture, and (3) quasicontinuous plastic flow. Finally the neck breaks when a maximum of three to four atoms are left in the contact. In the plastic flow regime, the conductance and thus the contact area shrink exponentially with elongation of the neck, suggesting that plastic deformation occurs locally within 5 to 6 atomic layers. The stress applied during plastic flow is initially of the order of 10 GPa and gradually increases to (approximately-equal-to) 20 GPa shortly before the neck breaks. Accounting for a surface force contribution, an intrinsic yield strength of the order of 5 to 8 GPa is obtained, which is more than one order of magnitude larger than the macroscopic yield strength of Au. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.116493
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