ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
The interdiffusivity within multilayered electrodeposited thin films of NiPx/NiPy has been measured using an x-ray technique. The NiPx, which can be deposited in the range 0≤x≤25 at. %, is crystalline at low phosphorus content but amorphous at high phosphorus content, so that films with a range of crystalline and amorphous structures could be prepared. Measurements on fully amorphous multilayers, where x,y(approximately-greater-than)18 at. %, give an interdiffusivity of order 10−22 m2 s−1 at 120 °C, which decreases with time, probably due to structural relaxation. The diffusivity decreases with decreasing repeat length of the films, with a critical repeat length of 40 A(ring). Crystalline/amorphous films show qualitatively different behavior, with the low-phosphorus layer governing the extent of a more limited diffusion phenomenon. This has been interpreted as the diffusion of phosphorus into a limited number of sites within the grain boundaries of the crystalline layers.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.351528
Permalink