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  • 1
    Electronic Resource
    Electronic Resource
    Nonreciprocal differential detection method for scanning Kerr-effect microscopy : The 41st annual conference on magnetism and magnetic materials (1997)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 81 (1997), S. 5015-5017 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We describe an optical detection scheme for scanning Kerr-effect microscopy (SKEM) which does not require modification of the magnetic state of a sample for domain observation. The scheme exploits the nonreciprocal nature of the magneto-optic Kerr effect (MOKE) to distinguish polarization rotation due to sample magnetization from other spurious sources, such as sample roughness and birefringence of the microscope optics. We present SKEM images of domain structures in lithographically patternedNi81Fe19 elements which demonstrate the imaging capabilities of the new detection scheme for materials with typical MOKE magnitudes.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.365550
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  • 2
    Electronic Resource
    Electronic Resource
    Vectorial second-harmonic magneto-optic Kerr effect measurements (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 5980-5982 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A significant modification of an existing experimental technique based on the second-harmonic magneto-optical Kerr effect (SH-MOKE) is introduced. With a p-polarized pumping optical wave incident upon a magnetic film, the transverse component of magnetization causes a change in the second-harmonic generation efficiency of the material and the longitudinal component of the magnetization produces a change in the polarization rotation and/or ellipticity of the second-harmonic signal. This permits simultaneous vectorial measurement of the in-plane magnetization components. Examples of measured hysteresis loops from 50 nm thick permalloy films and procedures for SH-MOKE signal calibration are presented.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.372586
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  • 3
    Electronic Resource
    Electronic Resource
    Nonlinear magneto-optic measurement of flux propagation dynamics in thin Permalloy films (2002)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 91 (2002), S. 1066-1073 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Time-resolved nonlinear optics are used to study the propagation of magnetic flux pulses in a 250 nm Permalloy film. The flux is generated in the film by coupling it to a coplanar waveguide structure driven with broadband voltage pulses. Flux pulses propagated in the film with a phase velocity of 4.2×105 m/s and a group velocity of 1.5×105 m/s. Both velocities are consistent with the predictions of Damon–Eshbach theory for magnetostatic surface waves with 200–300 μm wavelengths. Within 100 μm of the excitation source, flux pulses decayed monotonically but with no measurable delay. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1421040
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  • 4
    Electronic Resource
    Electronic Resource
    〉Study of NiFe/Al/Al2O3 magnetic tunnel junction interfaces using second-harmonic magneto-optic Kerr effect (1999)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 85 (1999), S. 5273-5275 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Using the second-harmonic magneto-optic Kerr effect (SHMOKE), we have measured the interfacial magnetic properties of NiFe/Al/Al2O3 heterostructures as a function of Al2O3 thickness and processing conditions. The samples were prepared like magnetic tunnel junctions except that the top electrodes were not deposited. A large change in SHMOKE contrast was observed for different oxidation processes and Al2O3 thicknesses. The magnetic SHMOKE contrast from a plasma oxidized sample in which the oxidation front is thought to be inside the original NiFe film is 70%, whereas the SHMOKE contrast from a thermally oxidized NiFe/Al sample, in which the oxidation front is ∼1 nm from the Al/NiFe interface is only 15%. Further, the phase of the signal is reversed between the two structures. The SHMOKE data have been correlated with tunneling measurements on similarly fabricated structures. For the two samples listed above, the junction resistivity varied from 10−1 Ω cm2 (plasma oxidized) to 10−6 Ω cm2 (thermally oxidized). These results indicate that SHMOKE may be useful for assessing tunnel junction quality during processing.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.369852
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  • 5
    Electronic Resource
    Electronic Resource
    Inductive measurement of ultrafast magnetization dynamics in thin-film Permalloy (1999)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 85 (1999), S. 7849-7862 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: An inductive technique for the measurement of dynamical magnetic processes in thin-film materials is described. The technique is demonstrated using 50 nm films of Permalloy (Ni81Fe19). Data are presented for impulse- and step-response experiments with the applied field pulse oriented in the plane of the film and transverse to the anisotropy axis. Rotation times as short as 200 ps and free oscillations of the magnetization after excitation are clearly observed. The oscillation frequency increases as the dc bias field parallel to the anisotropy axis increases as predicted by classical gyromagnetic theory. The data are fitted to the Landau–Lifshitz equation, and damping parameters are determined as a function of dc bias field. Damping for both impulse and step excitations exhibits a strong dependence on bias field. Damping for step excitations is characterized by an anomalous transient damping which rapidly increases at low dc bias field. Transformation of the data to the frequency domain reveals a higher order precessional mode which is also preferentially excited at low dc bias fields. A possible source for both phenomena is precessional mode saturation for large peak rotations. The technique has the potential for 20 ps resolution, although only 120 ps resolution is demonstrated due to the limited bandwidth of the waveguides used. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.370596
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  • 6
    Electronic Resource
    Electronic Resource
    A scanning near-field optical microscope for the imaging of magnetic domains in reflection (1996)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 715-725 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The design and implementation of a scanning near-field optical microscope expressly intended for the imaging of magnetic domains in reflection with subwavelength resolution is described. The microscope employs ∼40 nm silver particles optically excited at the plasmon resonance as the near-field probes. Special attention is given to the Newton ring interferometer used to regulate the separation between the near-field probe and the sample. The results of two tests of the microscope performance are presented. The first is a measurement of the dependence of the near-field magneto-optic Kerr effect on probe/sample spacing for a longitudinally magnetized metallic thin film. The effect decreases rapidly with increasing separation with a length scale comparable to the probe size. The second is a series of images of a domain in a perpendicularly magnetized multilayer metallic film at different probe/sample spacings. The images indicate a persistent effect with increasing separation but diminishing resolution. Fundamental differences between the near-field magneto-optic Kerr effect for perpendicularly and longitudinally magnetized samples is discussed. An estimate is made as to the fundamental limit of resolution with this particular form of near-field microscopy. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1146658
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  • 7
    Electronic Resource
    Electronic Resource
    ADDENDUM: "Nonreciprocal differential detection method for scanning Kerr-effect microscopy" [J. Appl. Phys. 81, 5015 (1997)] (1997)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 82 (1997), S. 5877-5877 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: It has come to our attention that images of static domain patterns in Permalloy using a quadrant-detection scheme were first obtained by Clegg, Heyes, Hill, and Wright in 1991.12 Thus, our claim to have been the first group to image static domains using such a method was incorrect. The description of the instrument and its principle of operation remain correct. The quality of the image presented3 represents an improvement over previously published results using a similar detection scheme, permitting an unambiguous determination of Néel wall polarity within the imaged domain structures. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.366406
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  • 8
    Electronic Resource
    Electronic Resource
    Coherent control of precessional dynamics in thin film permalloy (2000)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 76 (2000), S. 2113-2115 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We demonstrate a method of eliminating overshoot and ringing in magnetization dynamics when the system bandwidth includes the intrinsic ferromagnetic resonance (FMR). The method employs staggered step excitation for the cancellation of FMR oscillations while maximizing the risetime of the magnetization response. The second-harmonic magneto-optic Kerr effect is used to measure the magnetic response at a localized spot on the sample. The measured response is adequately modeled with the Landau–Lifshitz–Gilbert differential equation. We explain the observed behavior in terms of destructive interference.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.126280
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  • 9
    Electronic Resource
    Electronic Resource
    Subnanosecond magnetization dynamics measured by the second-harmonic magneto-optic Kerr effect (1999)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 74 (1999), S. 3386-3388 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have measured the in-plane magnetization dynamics of Ni81Fe19 films using the surface- and interface-sensitive second-harmonic magneto-optic Kerr effect. The dynamical magnetization was measured on patterned Ni81Fe19 stripes as a function of an in-plane magnetic field applied parallel to the anisotropy axis. The excitation sources were 100 ps risetime magnetic field impulses and steps. The minimum magnetization switching times were 〈300 ps, and precessional free-induction decay was observed. The dynamics for both impulse and step excitation are fitted to the Landau–Lifshitz equation, yielding values for the anisotropy field, gyroscopic splitting factor, and damping. The local surface precessional frequency and anisotropy are different from the average bulk values, demonstrating that this technique possesses the necessary sensitivity to detect variations in localized surface and interface dynamics. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.123353
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  • 10
    Electronic Resource
    Electronic Resource
    Observation of the transverse second-harmonic magneto-optic Kerr effect from Ni81Fe19 thin film structures (1996)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 68 (1996), S. 1573-1575 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report second-harmonic magneto-optic Kerr measurements on air-exposed, polycrystalline Ni81Fe19 thin films, ranging in thickness from 1 nm to 2 μm, on Al2O3 coated Si (001). For samples thicker than 20 nm, in the transverse Kerr geometry, we observe a factor of 4 change in second-harmonic intensity upon magnetization reversal. For thin samples, we observe interference between second-harmonic fields from the various interfaces and deterioration of ferromagnetism in the 1 and 2 nm films. Modeling suggests that the Ni81Fe19/Al2O3 interface has a larger second-order susceptibility than the air/Ni81Fe19 surface. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.115703
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