ALBERT

All Library Books, journals and Electronic Records Telegrafenberg

feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We measure the per-carrier nonlinear responses caused by photoexcited carriers in two strained [111]-oriented InGaAs/GaAs multiple-quantum-well structures, and we compare them to that measured in a [100]-oriented structure. Without an external bias, we find that the absorption coefficient changes per photogenerated carrier for the [111]-oriented piezoelectric materials are smaller than for the [100]-oriented materials, not larger, as originally suggested. Subsequently, measurements of the per-carrier nonlinear responses as a function of reverse bias voltage demonstrate that the smaller per-carrier nonlinearities measured for the [111] structures are partially the result of a broadening of the excitons by the huge in-well fields, but can be primarily attributed to the quality of the [111]-grown materials. When corrected for differing in-well fields and for differing excitonic linewidths, the per-carrier responses are similar in magnitude, suggesting that the [111] response may eventually approach that of [100] material, but probably will not significantly exceed it. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 2
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The use of room- and low-temperature photoluminescence (PL) spectroscopy for the assessment of n-type pseudomorphic AlGaAs/InGaAs/GaAs high-electron-mobility transistor structures is reported. We describe a method to determine the InAs mole fraction x, the channel layer thickness L, and the confined two-dimensional electron gas density (ns), based on the comparison between the PL transitions and the recombination energies derived from self-consistent calculations of the subband structure. A detailed analysis of the optical transitions and their dependence on the Fermi level position and temperature is performed. It is shown that, in real devices, the high sensitivity of the recombination energies and intensities on small changes of the parameters x, L, and ns allows us to detect deviations from their nominal structural parameters within the uncertainty of the molecular beam epitaxy growth technique. The present assessment procedure has been applied to a significant number of samples, and it has been backed by independent measurements of these parameters by more sophisticated techniques such as Shubnikov–de Haas and PL excitation in standard and gated samples, and by physical techniques like transmission electron microscopy and Auger spectroscopy.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 3
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: By embedding piezoelectric InGaAs/GaAs multiple quantum wells (MQWs) in specifically designed p-i-n structures, we demonstrate that the nonlinear optical response can be used to identify the dominant screening mechanisms and simultaneously to determine the strain distribution. Furthermore, we show that a knowledge of the screening mechanisms and spatial band structure, in turn, can be used to control the nonlinear optical response. For this demonstration, we fabricate two p-i(MQW)-n samples on [111]-oriented GaAs substrates. The samples are designed such that, if the dominant screening is associated with photogenerated carriers that remain in the wells, a blue shift of the exciton would be expected in each. By contrast, if the screening is associated with carriers that have escaped the wells and moved to screen the entire MQW, one will shift to the blue and the other to the red if the lattice is mechanically clamped, but both will shift to the red if the lattice is mechanically free. The observation of a blue shift and a red shift indicates that, while in-well screening may be present, the dominant screening is out-of-well and that these particular structures are mechanically clamped to the lattice constant of the GaAs. Most importantly, these results illustrate the added flexibility that the piezoelectric field gives in tailoring the nonlinear optical response. © 1994 American Institute of Physics.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 4988-4997 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The properties of deep donor states (DX centers) in III-V alloys are discussed in relation to their influence on device characteristics and performance. The techniques to avoid or minimize such deleterious effects in AlGaAs-based devices are discussed, along with their physical basis, and some guidelines for improved III-V device design are established. New results about the benefits of proper donor selection, the role of In alloying, the advantage of δ doping in layers and in modulation-doped devices, and the use of AlInAs and InGaP as alternative wide band-gap III-V alloys are presented.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 5
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: High-resolution x-ray diffractometry has been applied to the structural characterization of piezoelectric strained InGaAs/GaAs multiquantum well p-i-n diodes grown by molecular beam epitaxy on (111)B GaAs substrates. Reference samples simultaneously grown on (001) GaAs have been also characterized. Diodes with 3, 7, and 10 periods and different well to barrier thickness ratio have been studied. Symmetric and asymmetric reflections at various azimuths were measured and the scans were fitted with theoretical curves obtained through a dynamical simulation program developed in our lab. The comparison between experimental and simulated profiles has enabled us to determine the main structural parameters of the samples. High-resolution x-ray diffractometry provided accurate data about period and capping layer thicknesses, indium content in the wells and state of relaxation, information which cannot be always obtained in (111)B samples from other characterization techniques such as photoluminescence or photocurrent spectroscopies. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 6
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 75 (1999), S. 2407-2409 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: AlxGa1−xN/GaN heterostructure field-effect transistors with different Al concentrations (0.15〈x〈0.25) and barrier widths (150 Å〈WB〈350 Å) have been fabricated and characterized. Experimental results were analyzed by using a self-consistent solution of the Schrödinger and Poisson equations with the proper boundary conditions. The total (piezoelectric and spontaneous) polarization has been included as a fitting parameter in the self-consistent calculations. From the analysis of the transistor charge-control experimental data, a linear increase of the polarization field with the Al concentration has been found. Our results indicate that the slope of such dependence, and the magnitude of the total polarization field are lower than the predicted ones using the usually accepted values of the piezoelectric and spontaneous polarization coefficients. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 7
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 67 (1995), S. 950-952 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The contribution of the in-well screening of the piezoelectric field to the nonlinear optical response of a [111]-oriented strained InGaAs/GaAs multiple quantum well is separated from, and compared to, that associated with the out-of-well screening and with bleaching by using picosecond nondegenerate differential transmission techniques. These measurements demonstrate that the per-carrier nonlinearity associated with the in-well screening is smaller than that associated with the out-of-well screening by a factor roughly equal to the number of wells. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 8
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 78 (2001), S. 2390-2392 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Longwavelength InGaAs/GaAs quantum-well infrared photodetectors with indium contents ranging from 25% to 40% have been grown and characterized. Material quality has been assessed by photoluminescence and transmission electron microscopy. Intersubband photocurrent, excited by polarized (TE or TM) infrared light, has been analyzed in order to determine the responsivity for normal-incident radiation. It is found that the TE to TM responsivity ratio is lower than 10% in all the samples studied. By changing the indium content from 25% to 40%, the increase in the TE to TM photoresponse ratio is as low as 3%. Our results are opposite to previous reports of experimental observation of significant TE-polarized light absorption. However, the low efficiency for normal-incident radiation agrees with various theoretical predictions. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 9
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 66 (1995), S. 857-859 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have time-resolved the piezoelectric optical nonlinearities of a strained, [111]-oriented InGaAs/GaAs multiple quantum well p-i-n structure. By monitoring the temporal evolution of the excitonic absorption spectrum, we follow the photogenerated carriers as they drift to form the space-charge field responsible for screening the piezoelectric field. From the carrier dynamics, we can separate the contribution of in-well screening from that of the long-range screening associated with carriers that have escaped the wells. We have determined that in narrow quantum wells, in-well screening is smaller than long-range screening and that in-well screening is obscured by the concurrent onset of strong bleaching. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 10
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 66 (1995), S. 2223-2225 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The features present in the capacitance– and conductance–voltage characteristics of [100]- and [111]-oriented InGaAs/GaAs multi-quantum well (MQW) p-i-n structures under illumination are described. Sequential tunneling of electrons and holes is proposed to explain the different peaks observed, as they occur at voltages corresponding to resonant alignment of energy levels of adjacent wells. Two kinds of piezoelectric [111] devices are analyzed, with positive or negative average electric fields in the MQW region. The voltage corresponding to zero average electric field in the MQW is detected by a feature in the dark device capacitance. For the sample with negative average electric field, the capacitance characteristics clearly reflect the presence and evolution with voltage of a long range screening of the piezoelectric fields by the photogenerated carriers. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...