Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
58 (1987), S. 2010-2017
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
This article describes the design of a scanning tunneling microscope (STM) which is suitable for surface science work. Various concepts in mechanical structure and electronic circuitry of the STM have been pursued to optimize its performance. This STM has been designed especially to meet the requirement of in situ sample preparation and sample transfer in ultrahigh vacuum. The electronics of this STM are capable of taking simultaneous images with opposite polarities of tunneling voltages.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1139508
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